CY28551LFXC Silicon Laboratories Inc, CY28551LFXC Datasheet - Page 22

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CY28551LFXC

Manufacturer Part Number
CY28551LFXC
Description
Clock Generators & Support Products Universal System Clk Intel AMD SiS Via
Manufacturer
Silicon Laboratories Inc
Datasheet

Specifications of CY28551LFXC

Lead Free Status / RoHS Status
Lead free / RoHS Compliant

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Rev 1.1, Faburary 1, 2008
AC Electrical Specifications
T
T
T
T
T
L
T
T
V
V
V
CPU at 3.3V (SSC refers to –0.5% spread spectrum)
T
T
V
Δ
V
ΔV
T
T
T
PCIEX
T
T
T
T
T
T
T
L
T
T
V
V
V
DOT
T
ACC
ACCUM
ACC
PERIODSSAbs
PERIODSSAbs
PERIODSSAbs
SKEW
CCJ
R
RFM
R
F
DIFF
DC
CYC
DC
PERIOD
PERIODSS
PERIODAbs
PERIODSSAbs
SKEW
CCJ
R
RFM
DC
_max
_min
OX
DIFF
CM
_max
_min
OX
Parameter
/T
/T
CM
F
F
266 MHz CPUT and CPUC Absolute
Period, SSC
333 MHz CPUT and CPUC Absolute
Period, SSC
400 MHz CPUT and CPUC Absolute
Period, SSC
CPU0 to CPU1
CPUT/C Cycle to Cycle
Long Term Accuracy
CPUT and CPUC Rise and Fall Times
Rise/Fall Matching
Max Output Voltage
Min Output Voltage
Crossing Point Voltage at 0.7V Swing
Output Rise Edge Rate
Output Fall Edge Rate
Differential Voltage
Change in VDIFF_DC Magnitude
Common Mode Voltage
Change in VCM
Duty Cycle
Jitter, Cycle to Cycle
Jitter, Accumulated
PCIEXT and PCIEXC Duty Cycle
100 MHz PCIEXT and PCIEXC Period Measured at crossing point V
100 MHz PCIEXT and PCIEXC Period,
SSC
100 MHz PCIEXT and PCIEXC Absolute
Period
100 MHz PCIEXT and PCIEXC Absolute
Period, SSC
Any PCIEXT/C to PCIEXT/C Clock
Skew
PCIEXT/C Cycle to Cycle Jitter
PCIEXT/C Long Term Accuracy
PCIEXT and PCIEXC Rise and Fall
Times
Rise/Fall Matching
Max Output Voltage
Min Output Voltage
Crossing Point Voltage at 0.7V Swing
DOT96T and DOT96C Duty Cycle
Description
(continued)
Measured at crossing point V
@ 1 clock
Measured at crossing point V
@ 1 clock
Measured at crossing point V
@ 1 clock
Measured at crossing point V
Measured at crossing point V
Measured at crossing point V
Measured differentially from ±150 mV
Measured single-endedly from ±75 mV
Math averages Figure 14
Math averages Figure 14
Measured @ K8 test load using VOCM ±
400 mV, 0.850V to 1.650V
Measured @ K8test load using VOCM ±
400 mV, 1.650V to 0.850V
Measured @ K8 test load (single-ended)
Measured @ K8 test load (single-ended)
Measured @ K8 test load (single-ended)
Measured @ K8 test load (single-ended)
Measured at V
Measured at V
Measured at V
Measured at crossing point V
Measured at crossing point V
Measured at crossing point V
@ 1 clock
Measured at crossing point V
@ 1 clock
Measured at crossing point V
Measured at crossing point V
Measured at crossing point V
Measured differentially from ±150 mV
Measured single-endedly from ±75 mV
Math averages, see Figure 14
Math averages, see Figure 14
Measured at crossing point V
Condition
OX
OX
OX
OX
OX
OX
OX
OX
OX
OX
OX
OX
OX
OX
OX
OX
OX
OX
@ 0.1s
@ 0.1s
3.66463
2.91470
2.41475
9.99900
9.99900
9.87400
9.87400
–1000
–150
–200
Min.
–0.3
1.05
–0.3
300
300
2.5
0.4
2.5
45
45
45
2
2
0
CY28551
Page 22 of 29
3.85422
3.10038
2.59782
10.0010
10.0010
10.1260
10.1763
Max.
1000
1.15
1.45
1.15
150
200
100
100
550
200
250
125
100
550
2.3
85
20
53
55
20
55
8
7
7
8
Unit
ppm
V/ns
V/ns
V/ns
ppm
V/ns
mV
mV
mV
mV
ns
ns
ns
ps
ps
ps
ps
ns
ns
ns
ns
ps
ps
%
%
%
%
%
V
V
V
V
V
V

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