STM32F205ZFT6 STMicroelectronics, STM32F205ZFT6 Datasheet - Page 112
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STM32F205ZFT6
Manufacturer Part Number
STM32F205ZFT6
Description
MCU ARM 768KB FLASH 144LQFP
Manufacturer
STMicroelectronics
Series
STM32r
Datasheet
1.STM32F205RBT6.pdf
(163 pages)
Specifications of STM32F205ZFT6
Core Processor
ARM® Cortex-M3™
Core Size
32-Bit
Speed
120MHz
Connectivity
CAN, I²C, IrDA, LIN, MMC, SPI, UART/USART, USB OTG
Peripherals
Brown-out Detect/Reset, DMA, I²S, LCD, POR, PWM, WDT
Number Of I /o
114
Program Memory Size
768KB (768K x 8)
Program Memory Type
FLASH
Eeprom Size
-
Ram Size
132K x 8
Voltage - Supply (vcc/vdd)
1.8 V ~ 3.6 V
Data Converters
A/D 24x12b; D/A 2x12b
Oscillator Type
Internal
Operating Temperature
-40°C ~ 85°C
Package / Case
144-LQFP
Lead Free Status / Rohs Status
Lead free / RoHS Compliant
Other names
497-11165
Available stocks
Company
Part Number
Manufacturer
Quantity
Price
Company:
Part Number:
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Manufacturer:
STMicroelectronics
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Company:
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STM32F205ZFT6
Manufacturer:
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Electrical characteristics
Note:
112/163
Table 62.
1. Better performance could be achieved in restricted V
2. Based on characterization, not tested in production.
3. If IRROFF is set to V
ADC accuracy vs. negative injection current: Injecting a negative current on any of the
standard (non-robust) analog input pins should be avoided as this significantly reduces the
accuracy of the conversion being performed on another analog input. It is recommended to
add a Schottky diode (pin to ground) to standard analog pins which may potentially inject
negative currents.
Any positive injection current within the limits specified for I
Section 5.3.16
Figure 49. ADC accuracy characteristics
1. Example of an actual transfer curve.
2. Ideal transfer curve.
3. End point correlation line.
4. E
Symbol
a
temperature range.
EO = Offset Error: deviation between the first actual transition and the first ideal one.
EG = Gain Error: deviation between the last ideal transition and the last actual one.
ED = Differential Linearity Error: maximum deviation between actual steps and the ideal one.
EL = Integral Linearity Error: maximum deviation between any actual transition and the end point
correlation line.
EO
EG
ED
ET
EL
T
= Total Unadjusted Error: maximum deviation between the actual and the ideal transfer curves.
Total unadjusted error
Offset error
Gain error
Differential linearity error
Integral linearity error
ADC accuracy
does not affect the ADC accuracy.
Parameter
DD
, this value can be lowered to 1.65 V when the device operates in a reduced
(1)
Doc ID 15818 Rev 6
f
f
V
PCLK2
ADC
DDA
= 30 MHz, R
= 1.8
= 60 MHz,
Test conditions
DD
(3)
, frequency and temperature ranges.
to 3.6 V
AIN
< 10 kΩ,
INJ(PIN)
STM32F205xx, STM32F207xx
and ΣI
±1.5
±1.5
±1.5
Typ
±2
±1
INJ(PIN)
Max
±2.5
±3
±2
±5
±3
(2)
in
Unit
LSB