PPC5561MVZ132 Freescale Semiconductor, PPC5561MVZ132 Datasheet - Page 28

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PPC5561MVZ132

Manufacturer Part Number
PPC5561MVZ132
Description
Manufacturer
Freescale Semiconductor
Datasheet

Specifications of PPC5561MVZ132

Lead Free Status / Rohs Status
Supplier Unconfirmed
Electrical Characteristics
3.13.2
1
28
Spec
10
11
12
13
14
15
These specifications apply to JTAG boundary scan only. JTAG timing specified at: V
Refer to
1
2
3
4
5
6
7
8
9
TCK
TCK cycle time
TCK clock pulse width (measured at V
TCK rise and fall times (40% to 70%)
TMS, TDI data setup time
TMS, TDI data hold time
TCK low to TDO data valid
TCK low to TDO data invalid
TCK low to TDO high impedance
JCOMP assertion time
JCOMP setup time to TCK low
TCK falling-edge to output valid
TCK falling-edge to output valid out of high impedance
TCK falling-edge to output high impedance (Hi-Z)
Boundary scan input valid to TCK rising-edge
TCK rising-edge to boundary scan input invalid
Table 21
3
IEEE 1149.1 Interface Timing
for Nexus specifications.
Table 20. JTAG Pin AC Electrical Characteristics
Characteristic
MPC5561 Microcontroller Data Sheet, Rev. 2.0
Figure 6. JTAG Test Clock Input Timing
1
DDE
÷ 2)
3
2
t
t
TMSS,
TMSH,
t
t
Symbol
TCKRISE
JCMPPW
t
t
t
DDE
t
t
t
t
TDOHZ
t
JCMPS
t
BSDHZ
BSDST
BSDHT
BSDVZ
t
JCYC
t
TDOV
BSDV
TDOI
JDC
t
t
= 3.0–3.6 V and T
TDIS
TDIH
1
Min.
Freescale Semiconductor
100
100
40
25
40
50
50
2
5
0
A
= T
Max.
60
20
20
50
50
50
3
L
to T
H
.
Unit
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns