LFE3-150EA-8FN1156C Lattice, LFE3-150EA-8FN1156C Datasheet - Page 105
![IC FPGA 149K LUTS 586I/O FN1156](/photos/40/32/403255/fn1156_sml.jpg)
LFE3-150EA-8FN1156C
Manufacturer Part Number
LFE3-150EA-8FN1156C
Description
IC FPGA 149K LUTS 586I/O FN1156
Manufacturer
Lattice
Series
ECP3r
Datasheets
1.LFE3-150EA-7FN672C.pdf
(136 pages)
2.LFE3-35EA-8FN672I.pdf
(4 pages)
3.LFE3-35EA-8FN672I.pdf
(21 pages)
Specifications of LFE3-150EA-8FN1156C
Number Of Logic Elements/cells
149000
Number Of Labs/clbs
18625
Total Ram Bits
7014400
Number Of I /o
586
Number Of Gates
-
Voltage - Supply
1.14 V ~ 1.26 V
Mounting Type
Surface Mount
Operating Temperature
0°C ~ 85°C
Package / Case
1156-BBGA
Lead Free Status / Rohs Status
Lead free / RoHS Compliant
Available stocks
Company
Part Number
Manufacturer
Quantity
Price
Company:
Part Number:
LFE3-150EA-8FN1156C
Manufacturer:
Transcend
Quantity:
1 000
Part Number:
LFE3-150EA-8FN1156C
Manufacturer:
LATTICE
Quantity:
20 000
Company:
Part Number:
LFE3-150EA-8FN1156CTW
Manufacturer:
Lattice Semiconductor Corporation
Quantity:
10 000
Lattice Semiconductor
Figure 3-19. Test Loads
Test Loads
Timing Jitter Bandpass
outputs
CMOS
C
S
S
L
1
1
- open, S
- closed, S
including probe and jig capacitance, 3pF max.
0db
2
- closed for V
2
20dB/Decade
- open for V
S
C
V
1
DDIO
L
Slopes:
I
OL
Stopband
Rejection
S
<20dB
2
Hi-Z test eqpt. ≥ 5Ωk
(atteunation 0dB)
OH
OL
I
OH
measurement.
measurement.
10Hz
Jitter Frequency
Passband Ripple
< ±1dB
3-52
SDO
SDO
SDO
SDO
*Risetime compensation.
>1/10 f
75Ω
75Ω
1%
1%
C
C
V
V
DDSD
L
DDSD
L
SCLK
DC and Switching Characteristics
1.0µF
1.0µF
LatticeECP3 Family Data Sheet
(atteunation 0dB)
75Ω test eqpt.
5.5-30pF*
24.9Ω
1%
(atteunation 3.5dB)
50 test eqpt.