EPF8452AQC160-4 Altera, EPF8452AQC160-4 Datasheet - Page 27
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EPF8452AQC160-4
Manufacturer Part Number
EPF8452AQC160-4
Description
IC FLEX 8000A FPGA 4K 160-PQFP
Manufacturer
Altera
Series
FLEX 8000r
Datasheet
1.EPF8282ATC100-3.pdf
(62 pages)
Specifications of EPF8452AQC160-4
Number Of Logic Elements/cells
336
Number Of Labs/clbs
42
Number Of I /o
120
Number Of Gates
4000
Voltage - Supply
4.75 V ~ 5.25 V
Mounting Type
Surface Mount
Operating Temperature
0°C ~ 85°C
Package / Case
160-MQFP, 160-PQFP
Lead Free Status / RoHS Status
Contains lead / RoHS non-compliant
Total Ram Bits
-
Other names
544-2259
Available stocks
Company
Part Number
Manufacturer
Quantity
Price
Company:
Part Number:
EPF8452AQC160-4
Manufacturer:
GENESIS
Quantity:
569
Part Number:
EPF8452AQC160-4
Manufacturer:
ALTERA/阿尔特拉
Quantity:
20 000
Operating
Conditions
Altera Corporation
Symbol
V
V
I
T
T
T
Table 9. FLEX 8000 5.0-V Device Absolute Maximum Ratings
OUT
STG
AMB
J
CC
I
Supply voltage
DC input voltage
DC output current, per pin
Storage temperature
Ambient temperature
Junction temperature
Parameter
Figure 15. FLEX 8000 AC Test Conditions
Tables 9
recommended operating conditions, operating conditions, and
capacitance for 5.0-V FLEX 8000 devices.
Power supply transients can affect AC
measurements. Simultaneous transitions
of multiple outputs should be avoided for
accurate measurement. Threshold tests
must not be performed under AC
conditions. Large-amplitude, fast-ground-
current transients normally occur as the
device outputs discharge the load
capacitances. When these transients flow
through the parasitic inductance between
the device ground pin and the test system
ground, significant reductions in
observable noise immunity can result.
Numbers in parentheses are for 3.3-V
devices or outputs. Numbers without
parentheses are for 5.0-V devices or
outputs.
through
No bias
With respect to ground
Under bias
Ceramic packages, under bias
PQFP and RQFP, under bias
FLEX 8000 Programmable Logic Device Family Data Sheet
12
provide information on absolute maximum ratings,
Conditions
(2)
Note (1)
Device
Output
Device input
rise and fall
times < 3 ns
(8.06 K )
(703 )
250
464
–2.0
–2.0
Min
–25
–65
–65
C1 (includes
JIG capacitance)
Max
150
135
150
135
7.0
7.0
25
To Test
System
VCC
Unit
mA
° C
° C
° C
° C
V
V
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