N25Q128A11BF840F Numonyx - A DIVISION OF MICRON SEMICONDUCTOR PRODUCTS, INC., N25Q128A11BF840F Datasheet - Page 182

• Manufacturer Part Number: N25Q128A11BF840F
• Description: IC SRL FLASH 128MB NMX 8-VDFPN
• Manufacturer: Numonyx - A DIVISION OF MICRON SEMICONDUCTOR PRODUCTS, INC.
• Series: Forté™r

Specifications of N25Q128A11BF840F

• Format - Memory: FLASH
• Memory Type: FLASH
• Memory Size: 128M (16M x 8)
• Speed: 108MHz
• Interface: SPI, 3-Wire Serial
• Voltage - Supply: 1.7 V ~ 2 V
• Operating Temperature: -40°C ~ 85°C
• Package / Case: 8-VDFPN
• Lead Free Status / Rohs Status: Lead free / RoHS Compliant
• Other names: N25Q128A11BF840F

16
Note:
Table 38.
1. Additional secure options are available upon customer request.
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Example:
Device type
N25Q = serial Flash memory, Quad I/O, XiP
Device density
128 = 128 Mbit
Technology
A = 65 nm
Feature set
1 = Byte addressability, Hold pin, Numonyx XiP
2 = Byte addressability, Hold pin, Basic XiP
3 = Byte addressability, Reset pin, Numonyx XiP
4 = Byte addressability, Reset pin, Basic XiP
Operating voltage
1 = VCC = 1.7 V to 2 V
Block Structure
B = Bottom
T = Top
E = Uniform (no boot sectors)
Package
F8 = VDFPN8 8 x 6 mm (MLP8) (RoHS compliant)
SF = SO16 (300 mils width) (RoHS compliant)
12 = TBGA24 6 x 8 mm (RoHS compliant)
Temperature and test flow
4 = Industrial temperature range, –40 to 85 °C
A = Automotive temperature range, –40 to 125 °C
H = Industrial temperature range, –40 to 85 °C
Security features
0 = No extra security
Packing options
E = Tray packing
F = Tape and reel packing
G = Tube packing
Device tested with standard test flow
Device tested with high reliability certified test flow
Device tested with high reliability certified test flow
Ordering information
For further information on line items not listed here or on any aspect of this device, please
contact your nearest Numonyx Sales Office.
Ordering information scheme
(1)
N25Q128
A 1 1
B
F8 4
0
E