datasheet. Catalyst Semiconductor, datasheet. Datasheet - Page 2

• Manufacturer Part Number: datasheet.
• Description: CAT24WC32
• Manufacturer: Catalyst Semiconductor

Temperature Under Bias
Storage Temperature ....................... –65°C to +150°C
Voltage on Any Pin with
V
Package Power Dissipation
V
Note:
(1) The minimum DC input voltage is –0.5 V. During transitions, inputs may undershoot to –2.0 V for periods of less than 20 ns. Maximum DC
(2) Output shorted for no more than one second. No more than one output shorted at a time.
(3) This parameter is tested initially and after a design or process change that affects the parameter.
(4) Latch-up protection is provided for stresses up to 100 mA on address and data pins from –1.0 V to V
(5) Maximum standby current (I
CC
CC
Doc. No. 1073, Rev. D
I
C
N
V
LTH
C
T
Respect to Ground
Capability (T
voltage on output pins is V
I
V
V
END
I/O
ZAP
SB
IN
with Respect to Ground ............. –2.0 V to +7.0 V
DR
V
= 1.8 V to 5.5 V, unless otherwise specified.
I
I
I
V
I
CC
CC
LO
OL1
OL2
LI
(3)(4)
IH
(3)
IL
(3)
(5)
(3)
(3)
(3)
Output Low Voltage (V
Output Low Voltage (V
ESD Susceptibility
Standby Current (V
Data Retention
Input/Output Capacitance (SDA)
Power Supply Current (Read)
Power Supply Current (Write)
Input Capacitance (other pins)
Endurance
A
Output Leakage Current
Latch-up
T
Input Leakage Current
= 25°C) .................................. 1.0 W
A
Input High Voltage
Input Low Voltage
= 25°C, f = 400 kHz, V
(1)
CC
............ –2.0 V to V
SB
+ 0.5 V, which may overshoot to V
) = 10µA for the Extended Automotive temperature range.
CC
MIL-STD-883, Test Method 1033
MIL-STD-883, Test Method 1008
MIL-STD-883, Test Method 3015
CC
CC
= 5.0 V)
–55°C to +125°C
= 3.0 V)
= 1.8 V)
JEDEC Standard 17
CC
CC
+ 2.0 V
= 5 V
V
V
V
OUT
IN
f
f
IN
SCL
SCL
I
OL
I
= GND or V
= GND to V
OL
= GND to V
V
V
= 100 kHz
= 100 kHz
CC
= 1.5 mA
I/O
= 3 mA
IN
+ 2.0 V for periods of less than 20 ns.
2
= 0 V
= 0 V
Lead Soldering Temperature (10 seconds) ...... 300°C
Output Short Circuit Current
Stresses above those listed under “Absolute Maximum Ratings” may
cause permanent damage to the device. These are stress ratings only,
and functional operation of the device at these or any other conditions
outside of those listed in the operational sections of this specification is not
implied. Exposure to any absolute maximum rating for extended periods
may affect device performance and reliability.
CC
CC
CC
1,000,000
V
CC
4000
100
100
–1
x 0.7
CC
+ 1.0 V.
(2)
....................... 100 mA
V
V
CC
CC
0.4
0.5
1
3
1
1
1
x 0.3
+ 1.0
8
6
Cycles/Byte
Years
Volts
mA
mA
mA
µA
µA
µA
pF
pF
V
V
V
V