DS26334 Dallas Semiconductor, DS26334 Datasheet - Page 97

• Manufacturer Part Number: DS26334
• Description: E1/T1/J1 Shortand Long-Haul Line Interface Unit
• Manufacturer: Dallas Semiconductor

Table 7-2. ID Code Structure
MSB
Version
Contact Factory
4 bits
Table 7-3. Device ID Codes
7.3 Test Registers
IEEE 1149.1 requires a minimum of two test registers: the Bypass Register and the Boundary Scan Register. An
optional test register has been included with the DS26334 design. This test register is the Identification Register
and is used with the IDCODE instruction and the Test-Logic-Reset state of the TAP controller.
7.3.1
This register contains both a shift register path and a latched parallel output for all control cells and digital I/O cells
and is n bits in length.
7.3.2
This register is a single 1-bit shift register used with the BYPASS, CLAMP, and HIGHZ instructions that provide a
short path between TDI and TDO.
7.3.3
The Identification Register contains a 32-bit shift register and a 32-bit latched parallel output. This register is
selected during the IDCODE instruction and when the TAP controller is in the Test-Logic-Reset state. See
7-2
and
DS26334
DEVICE
Boundary Scan Register
Bypass Register
Identification Register
Table 7-3
for more information about bit usage.
Device ID
16 bits
16-BIT ID
003Ch
DS26334 3.3V, 16-Channel, E1/T1/J1 Short/Long-Haul Line Interface Unit
JEDEC
00010100001
97 of 121
LSB
1
1
Table