74abtl3205 NXP Semiconductors, 74abtl3205 Datasheet - Page 7

• Manufacturer Part Number: 74abtl3205
• Description: 10-bit Btl Transceiver With Registers
• Manufacturer: NXP Semiconductors

1. For conditions shown as MIN or MAX, use the appropriate value specified under recommended operating conditions for the applicable type.
2. All typical values are at V
3. Not more than one output should be shorted at a time. For testing I
4. Due to test equipment limitations, actual test conditions are V
5. For B port input voltage between 3 and 5 volts I
Philips Semiconductors
DC ELECTRICAL CHARACTERISTICS
Over recommended operating free-air temperature range unless otherwise noted.
NOTES:
TTL signals CLKin, CLK-1/CLK-OUT, CLK-2/FP-OUT, /FP-IN, /PARITY t,A0..A7, OEB, MASTER/SLAVE, MODE, OEA1, OEA2
BTL signals CLK1BTL, CLK2BTL, B0..B7
1995 Jun 16
SYMBOL
SYMBOL
10-bit BTL transceiver with registers
I
I
V
V
V
V
I
I
I
I
I
I
I
I
I
OH
OFF
I
IH
IL
IL
OZH
OZL
OS
CC
techniques are preferable in order to minimize internal heating and more accurately reflect operational values. Otherwise, prolonged shorting
of a High output may raise the chip temperature well above normal and thereby cause invalid readings in other parameter tests. In any
sequence of parameter tests, I
OH
OL
IK
IK
High level output current
Power-off output current
High-level output voltage
Low-level output voltage
Input clamp voltage
In ut clam voltage
Input current at maximum
input voltage
Hi h l
High-level input current
Low-level input current
Low-level in ut current
Off-state output current
Off-state output current
Short-circuit output
current
Supply current (total)
3
l i
CC
t
PARAMETER
PARAMETER
= 5V, T
OS
t
tests should be performed last.
amb
= 25 C.
Tranmode High
Tranmode High
Tranmode High
Tranmode Low
Recmode High
Tranmode Low
Recmode High
Recmode Low
Recmode Low
Recmode Low
BTL
BTL
BTL
BTL
BTL
BTL
BTL
BTL
TTL
TTL
TTL
TTL
TTL
TTL
TTL
TTL
TTL
IH
will be greater than 100 A, but the parts will continue to function normally.
V
V
V
V
V
V
V
V
I
V
V
V
V
V
V
V
V
V
V
V
Bn = AIn = 0V
V
V
V
V
V
V
V
V
V
Mode = Low
V
Mode = High
V
V
OH
CC
IH
CC
IH
CC
IH
CC
IL
CC
IH
CC
IH
CC
IH
CC
CC
CC
I
CC
CC
CC
CC
CC
CC
CC
CC
CC
CC
CC
CC
CC
IH
TEST CONDITIONS
TEST CONDITIONS
= 0.5V or 5.5V
= MAX, V
= MIN, V
= MIN, V
= MIN, I
= –10 A
= MIN, I
= MIN, I
= MIN, I
= 1.8V and V
= MAX, V
= 0.0V, V
= MIN, V
= MIN to MAX,
= MIN, V
= MIN, V
= MIN, V
= MIN, I
= MIN, I
= MAX,
= MAX, V
= MAX, V
= MAX, V
= MAX, V
= MAX, V
= MAX, V
= MAX, V
= MAX, V
= MAX
= MAX
= MAX
= MAX
= MAX
OS
7
, the use of high-speed test apparatus and/or sample-and-hold
OH
OL
OL
OL
OH
OH
I
I
IH
IL
IL
IL
IL
IL
= I
= –18mA
IL
I
I
I
I
I
O
O
O
= 24mA
= 100mA
= 4mA
= –3mA
= 2.7V,
= 1.9V
= 3.5V
= 0.5V
= 0.75V
= MAX,
= MIN,
= MAX,
= MAX,
= MAX,
= MAX,
= 1.9V
= 1.9V
IK
= 2.7V
= 0.5V
= 0.0V
= MAX,
IL
= 1.3V for the B side.
4
5
1
1
4
0.75
MIN
100
–60
2.5
0.5
LIMITS
TYP
2.85
0.35
130
0.5
1.0
0.7
0.8
0.8
0.1
0.1
0.1
0.1
0.1
0.1
10
20
13
18
29
1
7
2
74ABTL3205
V
CC
MAX
–100
–150
1.10
–1.2
–1.2
100
100
100
–20
–50
3.4
0.5
20
50
12
21
25
43
50
3
Product specification
– 1.1
UNIT
UNIT
mA
mA
mA
mA
mA
mA
mA
V
V
V
V
V
V
V
A
A