lrs1331 Sharp Microelectronics of the Americas, lrs1331 Datasheet - Page 21

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lrs1331

Manufacturer Part Number
lrs1331
Description
Stacked Chip Flash Memory Sram
Manufacturer
Sharp Microelectronics of the Americas
Datasheet

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Stacked Chip (16M Flash & 4M SRAM)
Data Sheet
NOTES:
1. A write occurs during the overlap of a LOW S-CE
2. t
3. t
4. t
5. t
6. During this period, DQ pins are in the output state, therefore the input signals of
and S-WE going LOW. A write ends at the earliest transition among S-CE
S-CE
write to the end of write.
opposite phase to the outputs must not be applied.
A write begins at the latest transition among S-CE
of write.
write ends as S-CE
CW
BW
AS
WR
is measured from the address valid to the beginning of write.
S-UB, S-LB
is measured from the time of going LOW S-UB or LOW S-LB to the end of write.
is measured from the later of S-CE
is measured from the end of write to the address change. t
ADDRESS
2
going LOW and S-WE going HIGH. t
S-CE
S-CE
S-WE
D
D
OUT
IN
1
2
1
going HIGH, S-CE
Figure 10. Write Cycle Timing Diagram (S-CE Controlled)
1
(NOTE 4)
2
going LOW or S-CE
going LOW or S-WE going HIGH.
t
AS
WP
is measured from the beginning of
1
, a HIGH S-CE
1
going LOW, S-CE
2
going HIGH to the end
HIGH IMPEDANCE
WR
t
2
AW
and a LOW S-WE,
applied in case a
(NOTE 1)
(NOTE 6)
2
t
WP
t
WC
going HIGH
(NOTE 2)
(NOTE 3)
1
t
going HIGH,
CW
t
BW
t
DW
Data Valid
(NOTE 5)
t
t
WR
WR
t
DH
LRS1331
1331-10
21

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