saa5254 NXP Semiconductors, saa5254 Datasheet - Page 6

• Manufacturer Part Number: saa5254
• Description: Integrated Vip And Teletext Decoder Ivt1.1x
• Manufacturer: NXP Semiconductors

Philips Semiconductors
QUALITY AND RELIABILITY
This device will meet Philips Semiconductors General Quality Specification for Business group “Consumer Integrated
Circuits SNW-FQ-611-Part E” . The principal requirements are shown in Tables 1 to 4.
Group A
Table 1 Acceptance tests per lot
Group B
Table 2 Processability tests (by package family)
Group C
Table 3 Reliability tests (by process family)
Table 4 Reliability tests (by device type)
Notes to Tables 1 to 4
1. ppm = fraction of defective devices, in parts per million.
1996 Nov 07
Mechanical
Electrical
Solderability
Mechanical
Solder heat resistance
Operational life
Humidity life
Temperature cycling performance
ESD and latch-up
Integrated VIP and teletext decoder
(IVT1.1X)
LTPD = Lot Tolerance Percent Defective.
FPM = fraction of devices failing at test condition, in Failures Per Million.
FITS = Failures In Time Standard.
TEST
TEST
TEST
TEST
168 hours at T
temperature, humidity, bias
(1000 hours, 85 C, 85% RH or
equivalent test)
T
ESD Human body model
2000 V, 100 pF, 1.5 k
ESD Machine model
200 V, 100 pF, 1.5 k
latch-up 100 mA, 1.5
(absolute maximum)
stg(min)
to T
CONDITIONS
CONDITIONS
CONDITIONS
CONDITIONS
stg(max)
j
= 150 C
6
V
DD
cumulative target < 100 ppm
cumulative target < 100 ppm
< 7% LTPD
< 15% LTPD
< 15% LTPD
< 1500 FPM; equivalent to
< 100 FITS at T
< 2000 FPM
< 2000 FPM
< 15% LTPD
< 15% LTPD
< 15% LTPD
REQUIREMENTS
REQUIREMENTS
REQUIREMENTS
REQUIREMENTS
Preliminary specification
j
= 70 C
SAA5254
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