saa5233 NXP Semiconductors, saa5233 Datasheet - Page 6

• Manufacturer Part Number: saa5233
• Description: Dual Standard Decoder
• Manufacturer: NXP Semiconductors

Philips Semiconductors
QUALITY AND RELIABILITY
This device will meet the requirements of the “Philips Semiconductors General Quality Specification SNW-FQ-611E” in
accordance with “Quality Reference Pocketbook (order number 9398 510 34011)” . The principal requirements are as
shown in Tables 1 to 4.
Group A
Table 1 Acceptance tests per lot.
Group B
Table 2 Processability tests (by package family).
Group C
Table 3 Reliability tests (by process family).
Table 4 Reliability tests (by device type).
Note to Tables 1 to 4.
1. ppm = fraction of defective devices, in parts per million.
June 1994
Mechanical
Electrical
Solderability
Mechanical
Solder heat resistance
Operational life
Humidity life
Temperature cycling performance
ESD and latch-up
Dual standard PDC decoder
LTPD = Lot Tolerance Percent Defective.
FPM = fraction of devices failing at test condition, in Failures Per Million.
FITS = Failures In Time Standard.
TEST
TEST
TEST
TEST
168 hours at T
temperature, humidity, bias
(1000 hours, 85 C, 85% RH or
equivalent test)
T
ESD Human body model
2000 V; 100 pF; 1.5 k
ESD Machine model
200 V; 200 pF; 0
latch-up 100 mA; 1.5
(absolute maximum)
cumulative target: 100 ppm
cumulative target: 100 ppm
7% LTPD
15% LTPD
15% LTPD
stg(min)
to T
CONDITIONS
CONDITIONS
stg(max)
j
= 150 C
6
V
DD
REQUIREMENTS
REQUIREMENTS
at T
1500 FPM; equivalent to 100 FITS
2000 FPM
2000 FPM
15% LTPD
15% LTPD
15% LTPD
j
= 70 C
(1)
(1)
REQUIREMENTS
REQUIREMENTS
Objective specification
SAA5233
(1)
(1)