emc646sp16ak Emlsi Inc., emc646sp16ak Datasheet

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emc646sp16ak

Manufacturer Part Number
emc646sp16ak
Description
4mx16 Bit Cellularram
Manufacturer
Emlsi Inc.
Datasheet
Emerging Memory & Logic Solutions Inc.
4F Korea Construction Financial Cooperative B/D, 301-1 Yeon-Dong, Jeju-Si, Jeju-Do, Rep.of Korea Zip Code : 690-717
Tel : +82-64-740-1700 Fax : +82-64-740-1749~1750 / Homepage : www.emlsi.com
The attached datasheets are provided by EMLSI reserve the right to change the specifications and products. EMLSI will answer to
your questions about device. If you have any questions, please contact the EMLSI office.
Document Title
Revision History
Revision No.
0.0
0.1
4Mx16 bit CellularRAM
History
-. Initial Draft
-. Table 15 : Burst READ Cycle Timing Requirements
updated for tHZ
1
Date
Feb. 20
Apr.
EMC646SP16AK
23
4Mx16 CellularRAM
2009
2009
Remark
Preliminary

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emc646sp16ak Summary of contents

Page 1

... Tel : +82-64-740-1700 Fax : +82-64-740-1749~1750 / Homepage : www.emlsi.com The attached datasheets are provided by EMLSI reserve the right to change the specifications and products. EMLSI will answer to your questions about device. If you have any questions, please contact the EMLSI office. EMC646SP16AK 4Mx16 CellularRAM Date Feb. 20 2009 Apr ...

Page 2

... Deep Power-down(DPD) mode OPTIONS - Configuration: 64Mb (4 megabit x 16) - Vcc core / VccQ I/O voltage supply: 1.8V - Timing: 70ns access - Frequency: 80 MHz, 104 MHz, 133 MHz - Standby current at 85°C : 140µA(max) - Operating temperature range: Wireless -30°C to +85°C = 7.5ns) CLK 2 EMC646SP16AK 4Mx16 CellularRAM ...

Page 3

... Operating Mode (BCR[15]) Default = Asynchronous Operation......................................................................................... 26 Refresh Configuration Register............................................................................................................................................... 27 Partial Array Refresh (RCR[2:0]) Default = Full Array Refresh ......................................................................................... 28 Deep Power-Down (RCR[4]) Default = DPD Disabled ....................................................................................................... 28 Page Mode Operation (RCR[7]) Default = Disabled .......................................................................................................... 28 Device Identification Register.................................................................................................................................................. 28 Electrical Characteristics............................................................................................................................................................. 29 Timing Requirements................................................................................................................................................................... 31 Timing Diagrams.......................................................................................................................................................................... 35 EMC646SP16AK 4Mx16 CellularRAM 3 ...

Page 4

... Figure 48: Asynchronous WRITE (ADV# LOW) Followed by Burst READ ............................................................................. 59 Figure 49: Burst READ Followed by Asynchronous WRITE (WE# - Controlled) ..................................................................... 60 Figure 50: Burst READ Followed by Asynchronous WRITE Using ADV# ............................................................................... 51 Figure 51: Asynchronous WRITE Followed by Asynchronous READ - ADV# LOW ............................................................... 62 Figure 52: Asynchronous WRITE Followed by Asynchronous READ ..................................................................................... 63 EMC646SP16AK 4Mx16 CellularRAM 4 45 ...

Page 5

... Deep Power-Down Specifications ............................................................................................................................... 30 Table 12: Partial-Array Specifications and Conditions ................................................................................................................ 30 Table 13: Capacitance ................................................................................................................................................................ 30 Table 14: Asynchronous READ Cycle Timing Requirements ...................................................................................................... 31 Table 15: Burst READ Cycle Timing Requirements .................................................................................................................... 32 Table 16: Asynchronous WRITE Cycle Timing Requirements .................................................................................................... 33 Table 17: Burst WRITE Cycle Timing Requirements ................................................................................................................... 34 Table 18: Initialization and DPD Timing Parameters ................................................................................................................... 35 EMC646SP16AK 4Mx16 CellularRAM 5 ...

Page 6

... Note: Functional block diagrams illustrate simplified device operation. See pin descriptions(Table 1); Bus operations table(Table 2); and timing diagrams for detailed information. Address Decode 4,096K x 16 Logic DRAM MEMORY ARRAY Refresh Configuration Register (RCR) Device ID Register (DIDR) Bus Configuration Register (BCR) Internal 6 EMC646SP16AK 4Mx16 CellularRAM Input Output DQ[7:0] MUX and DQ[15:8] Buffers External ...

Page 7

... Vss must be connected to ground. VssQ Supply VssQ must be connected to ground. Note: 1. When using asynchronous mode or page mode exclusively, CLK and ADV# inputs can be tied to Vss. WAIT will be asserted but should be ignored during asynchronous and page mode operations. EMC646SP16AK Descriptions 7 4Mx16 CellularRAM ...

Page 8

... EMC646SP16AK 4Mx16 CellularRAM UB WAIT DQ[15:0] LB Low-z Data out L L Low-z Data High-z High Low Low-z High-z Config Low-z Reg.out X ...

Page 9

... When they reach a stable level at or above 1.7V, the device will require 150µs to complete its self-initialization process. During the initialization period, CE# should remain HIGH. When initialization is complete, the device is ready for normal operation. Figure 2: Power-Up Initialization Timing Vcc=1.7V Vcc VccQ t ≥ 150µs PU Device ready for normal operation Device Initialization 9 EMC646SP16AK 4Mx16 CellularRAM ...

Page 10

... During asychronous operation, the CLK input must be held static LOW. WAIT will be driven while the device is enabled and its state should be ignored. WE# LOW time must be limited to t Figure 3: READ Operation (ADV# LOW) WE# Address DATA LB#/UB# Note: ADV# must remain Low for PAGE MODE operation. CEM CE# OE# Address Valid Data Valid t = READ Cycle Time RC 10 EMC646SP16AK 4Mx16 CellularRAM Don’t Care ...

Page 11

... Figure 5: Page Mode READ Operation (ADV# LOW) CE# OE# WE# Address DATA LB#/UB# CE# OE# < t CEM Address Valid Data Valid t = WRITE Cycle Time WC . CEM t < CEM Add0 Add1 Add2 Add3 APA APA EMC646SP16AK 4Mx16 CellularRAM Don’t Care APA D3 Don’t Care ...

Page 12

... Note: Non-default BCR settings for burst mode READ (4-word burst): Fixed or variable latency; Latency code 2 (3 clocks); WAIT active LOW; WAIT asserted during delay. Diagram in the figure 6 is representative of variable latency with no refresh collision or fixed-latency access. Latency Code 2 (3 clocks EMC646SP16AK 4Mx16 CellularRAM Don’ ...

Page 13

... WAIT output will continue to be active, and as a result no other devices should directly share the WAIT connection to the controller. To continue the burst sequence, OE# is taken LOW, then CLK is restarted after valid data is available on the bus. The CE# LOW time Latency Code 2(3 clocks EMC646SP16AK 4Mx16 CellularRAM ...

Page 14

... Additional WAIT states inserted to allow refresh completion Note: Non-default BCR settings for refresh collision during variable-latency READ operation: Latency code 2 (3 clocks); WAIT active LOW; WAIT asserted during delay. EMC646SP16AK . If a burst suspension will cause CE# to remain LOW for CEM Don’ ...

Page 15

... When both the LB# and UB# are disabled (HIGH) during an operation, the device will disable the data bus from receiving or transmitting data. Although the device will seem to be deselected, it remains in an active mode as long as CE# remains LOW. External CellularRAM Pull-Up/ Pull-Down Resistor WAIT WAIT WAIT Other Other Device Device 15 EMC646SP16AK 4Mx16 CellularRAM . Mixed-mode operation facilitates a CEM ...

Page 16

... During this 150µs period, the current consumption will be higher than the specified standby levels, but considerably lower than the active current specification. DPD can be enabled by writing to the RCR using CRE or the software access sequence; DPD starts when CE# goes HIGH. DPD is disabled the next time CE# goes LOW and stays LOW for at least 10µs. EMC646SP16AK 16 4Mx16 CellularRAM ...

Page 17

... Select control register 1 A[19:18] CRE ADV# CE# OE# WE# LB#/UB# DQ[15:0] Note: 1. A[19:18] = 00b to load RCR, and 10b to load BCR. t AVH t AVS t AVH t VP Initiate control register access Write address bus value to control register 17 EMC646SP16AK 4Mx16 CellularRAM Address Address t CPH Data Valid Don’t Care ...

Page 18

... A[19:18] = 00b to load RCR, and 10b to load BCR. 3. CE# must remain LOW to complete a burst-of-one WRITE. WAIT must be monitored; additional WAIT cycles caused by refresh collisions require a corresponding number of additional CE# LOW cycles. Address Latch control register address Address t CBPH Note 3 High-Z 18 EMC646SP16AK 4Mx16 CellularRAM Data Valid Don’t Care ...

Page 19

... Note: A[19:18] = 00b to read RCR, 10b to read BCR, and 01b to read DIDR. t AVH AVH t AVS AADV Initiate register access OLZ Valid 19 EMC646SP16AK 4Mx16 CellularRAM Address Address t CPH OHZ t BHZ Data Valid Undefined Don’t Care ...

Page 20

... CE# must remain LOW to complete a burst-of-one READ. WAIT must be monitored; additional WAIT cycles caused by refresh collisions require a corresponding number of additional CE# LOW cycles. Latch control register address t t CBPH ABA Note OHZ BOE t ACLK t OLZ High-Z t KOH CR Valid 20 EMC646SP16AK 4Mx16 CellularRAM Address Address Data Valid Undefined Don’t Care ...

Page 21

... WRITE WRITE ADDRESS ADDRESS ADDRESS Max Max XXXXh CR Value In RCR : 0000h BCR : 0001h READ WRITE READ ADDRESS ADDRESS ADDRESS Max Max XXXXh CR Value Iout RCR : 0000h BCR : 0001h DIDR : 0002h 21 EMC646SP16AK 4Mx16 CellularRAM Max Don’t Care Max Don’t Care ...

Page 22

... Code 1 - Reserved 0 Code 2 1 Code 3 (default) 0 Code 4 1 Code 5 0 Code 6 1 Code 7 - Reserved BCR[10] WAIT Polarity 0 Active LOW 1 Active HIGH (default) 22 EMC646SP16AK 4Mx16 CellularRAM WAIT Drive Burst Reserved Reserved Strength Wrap(BW)* Must be set to “0” ...

Page 23

... EMC646SP16AK 4Mx16 CellularRAM 32 Word Continuous Burst Length Burst Linear Linear 0-1-2 ... 29-30-31 0-1-2-3-4-5-6-... 1-2-3 ... 30-31-0 1-2-3-4-5-6-7-... 2-3-4 ... 31-0-1 2-3-4-5-6-7-8-... 3-4-5 ... 0-1-2 3-4-5-6-7-8-9-... 4-5-6 ... 1-2-3 4-5-6-7-8-9-10-... 5-6-7 ... 2-3-4 5-6-7-8-9-10-11-... 6-7-8 ... 3-4-5 6-7-8-9-10-11-12-... 7-8-9 ... 4-5-6 7-8-9-10-11-12-13-... ... ... 14-15-16-...-11-12-13 14-15-16-17-18-19-20-... 15-16-17...-12-13-14 15-16-17-18-19-20-21-... ... ... 30-31-0-...-27-28-29 30-31-32-33-34-... 31-0-1-... -28-29-30 31-32-33-34-35- ...

Page 24

... Note: Non-default BCR setting: WAIT active LOW. Impedance Typ (Ω ) Full 25~30 1/2 50 (default) 1/4 100 Reserved End of row 24 EMC646SP16AK 4Mx16 CellularRAM Use Recommendation CL = 30pF to 50pF CL = 15pF to 30pF 104 MHz at light load CL = 15pF or lower BCR[ Data valid in current cycle BCR[ Data valid in next cycle Don’t Care ...

Page 25

... OL 1 Latency Normal Refresh Collision Valid Valid Output Output (default) Valid Output 25 EMC646SP16AK 4Mx16 CellularRAM Max Input CLK Frequency (MHz) 133 104 66(15ns) 66(15ns) 52(19.2ns) 104(9.62ns) 104(9.62ns) 80(12.5ns) 133(7.5ns Valid Valid Valid Output Output Output ...

Page 26

... Cycles AADV ACLK Valid Valid Output Output Valid Valid Input Input 26 EMC646SP16AK 4Mx16 CellularRAM Max Input CLK Frequency (MHz) 104 33(30ns) 33(30ns) 52(19.2ns) 52(19.2ns) 66(15ns) 66(15ns) 75(13.3ns) 75(13.3ns) 104(9.62ns) 80(12.5ns Valid Valid Valid Output Output Output ...

Page 27

... Page Mode Enable DPD Page Reserved Setting is ignored (Default 00b) RCR[4] Deep Power-Down 0 DPD Enable 1 DPD Disable (default) 27 EMC646SP16AK 4Mx16 CellularRAM Reserved PAR Must be set to “0” RCR[2] RCR[1] RCR[0] Refresh Coverage Full array (default ...

Page 28

... One-eighth of die 380000h-3FFFFFh DIDR[14:11] DIDR[10:8] Device version Device density Bit Version Density Setting Setting 2nd 0001b 64Mb 28 EMC646SP16AK 4Mx16 CellularRAM Size 4 Meg Meg Meg x 16 512 Meg Meg Meg x 16 512 DIDR[7:5] CellularRAM generation Bit ...

Page 29

... Symbol OUT 0V, CE CCQ CCQ SB 29 EMC646SP16AK 4Mx16 CellularRAM Rating -0.30V to VccQ + 0.3V -0.2V to +2.45V -0.2V to +2.45V -55°C to +150°C -30°C to +85°C +260°C Min Max 1.7 1.95 1.7 1.95 VccQ - 0.4 VccQ + 0.2 -0.20 0.4 0.80 VccQ 0.20 VccQ 1 1 Typ Max 70ns ...

Page 30

... Note: All tests are performed with the outputs configured for default setting of half drive strength (BCR[5:4] = 01b). Conditions V = VccQ or 0V; IN =25°C and not guaranteed. A Conditions IPAR Conditions VccQ/2 Test Points Test Points 50-Ohm DUT 30pF 30 EMC646SP16AK 4Mx16 CellularRAM Symbol Typ Symbol Array Partition Full 1/2 Standard power (no 1/4 designation ) 1/8 0 Symbol Min Max C 2.0 ...

Page 31

... CVS OHZ t 3 OLZ toward VccQ/ EMC646SP16AK 4Mx16 CellularRAM Unit Note Max µ ...

Page 32

... 1.2 KHKL t - 5.5 KHTL t 2 KOH OHZ t 3 OLZ refresh opportunity is satisfied by either of the following two conditions: a) clocked CE# CEM or V toward VccQ/ EMC646SP16AK 4Mx16 CellularRAM 104MHz 80MHZ Min Max Min Max 35 ...

Page 33

... WHZ WPH toward VccQ/ EMC646SP16AK 4Mx16 CellularRAM 70ns Unit Note Max - 7 ...

Page 34

... CEM t 1 CEW t 7.5 CLK t 2.5 CSP t 1 KHKL t - KHTL refresh opportunity is satisfied by either of the following two conditions: a) clocked CE# CEM or V toward VccQ/ EMC646SP16AK 4Mx16 CellularRAM 104MHz 80MHZ Max Min Max Min - 7 9. ...

Page 35

... Table 18: Initialization and DPD Timing Parameters Symbol t DPD t DPDX 1. DPD DPDX DPD Enabled DPD EXIT Min Max 150 10 150 35 EMC646SP16AK 4Mx16 CellularRAM (MIN) Vcc Device ready for normal operation t PU Device ready for Device Initialization normal operation Unit µ s µ s µ s ...

Page 36

... IH CE LB#/ DQ[15:0] High WAIT High Valid Address OLZ t BLZ t LZ Valid Output t CEW 36 EMC646SP16AK 4Mx16 CellularRAM BHZ t OHZ t HZ High-Z Don’t Care Undefined ...

Page 37

... OE WE High-Z DQ[15: High-Z WAIT V OL Valid Address AVS AVH t AADV CVS OLZ t BLZ t LZ Valid Output t CEW 37 EMC646SP16AK 4Mx16 CellularRAM BHZ t OHZ t HZ High-Z Don’t Care Undefined ...

Page 38

... Valid Valid Address Address CEM OLZ t t APA BLZ Valid Valid Output Output t CEW 38 EMC646SP16AK 4Mx16 CellularRAM Valid Valid Address Address BHZ t OHZ Valid Valid Output Output t HZ High-Z Don’t Care Undefined ...

Page 39

... KHKL Valid Address CEM t t ABA CSP t BOE OLZ KHTL CEW t ACLK High-Z Valid Output READ Burst Identified (WE# = HIGH) 39 EMC646SP16AK 4Mx16 CellularRAM OHZ t HD High-Z t KOH High-Z Don’t Care Undefined ...

Page 40

... CEM t t CSP ABA t BOE OLZ KHTL t CEW t ACLK Valid Output READ Burst Identified (WE# = HIGH) 40 EMC646SP16AK 4Mx16 CellularRAM CBPH OHZ t HD High-Z t KOH Valid Valid Valid Output Output Output Don’t Care Undefined High-Z ...

Page 41

... Valid Address t AVH AADV t CEM t CSP CEW READ Burst Identified (WE# = HIGH) 41 EMC646SP16AK 4Mx16 CellularRAM KHKL OHZ t BOE t OLZ KHTL High ACLK KOH High-Z Valid Output Don’t Care Undefined ...

Page 42

... AADV t CSP t CEM BOE t OLZ KHTL t CEW t ACLK Valid Output READ Burst Identified (WE# = HIGH) 42 EMC646SP16AK 4Mx16 CellularRAM KHKL CBPH OHZ KOH Valid Valid Valid Output Output Output Don’t Care Undefined High-Z ...

Page 43

... OE# can stay LOW during burst suspend. If OE# is LOW, DQ[15:0] will continue to output valid data. t CLK CEM HD t BOE t OLZ t KOH Valid Valid Valid Output Output Output t ACLK 43 EMC646SP16AK 4Mx16 CellularRAM Note 2 t CBPH OHZ OHZ Note High-Z t BOE t OLZ Valid Valid Valid Output Output Output Don’ ...

Page 44

... For burst READs, CE# must go HIGH before the second CLK after the WAIT period begins ( before the second CLK after WAIT asserts with BCR[8]=0, or before the third CLK after WAIT asserts with BCR[8]= CLK CSP Note 2 End of row Valid Valid Output Output KHTL t KOH 44 EMC646SP16AK 4Mx16 CellularRAM High-Z Don’t Care Undefined ...

Page 45

... Non-default BCR settings for burst READ at end of row : fixed or variable latency, WAIT active LOW, WAIT asserted during delay. (shown as solid line) 2. WAIT will be assert for LC cycles for variables latency cycles for fixed latency. End of row Valid output t KTHL Note 2 t KOH 45 EMC646SP16AK 4Mx16 CellularRAM Valid output Valid output t KTHL t KOH Don’t Care ...

Page 46

... OE WE DQ[15:0] IH High DQ[15:0] OH OUT WAIT High Valid Address WPH WP t WHZ CEW 46 EMC646SP16AK 4Mx16 CellularRAM CPH Valid Input t HZ High-Z Don’t Care ...

Page 47

... DQ[15: High DQ[15: OUT WAIT High Valid Address WPH WP t WHZ CEW 47 EMC646SP16AK 4Mx16 CellularRAM Valid Input t HZ High-Z Don’t Care ...

Page 48

... WPH DQ[15: High DQ[15: OUT WAIT High Valid Address WHZ t CEW 48 EMC646SP16AK 4Mx16 CellularRAM Valid Input High-Z Don’t Care ...

Page 49

... V IL DQ[15: High DQ[15: OUT WAIT High Valid Address t t AVS AVH CVS WHZ t CEW 49 EMC646SP16AK 4Mx16 CellularRAM t WPH Valid Input High-Z Don’t Care ...

Page 50

... WAIT asserts for LC cycles for both fixed and variable latency Latency Code (BCR[13:11]). 3. t required if t > 20ns. AS CSP t CLK Valid Address CSP t CEM KHTL CEW Note (WE# = Low) 50 EMC646SP16AK 4Mx16 CellularRAM KHKL CBPH t HZ High-Z Don’t Care ...

Page 51

... AS CSP t CLK t SP Valid Address t AVH CSP t CEM KHTL CEW Note WRITE Burst Identified (WE# = Low) 51 EMC646SP16AK 4Mx16 CellularRAM KHKL CBPH t HZ High-Z Don’t Care ...

Page 52

... For burst WRITEs, CE# must go HIGH before the second CLK after the WAIT period begins(before the second CLK after WAIT asserts with BCR[8]=0, or before the third CLK after WAIT asserts with BCR[8]=1). t CLK CSP Note Valid Valid Input Input End of row t KOH t KHTL 52 EMC646SP16AK 4Mx16 CellularRAM High-Z Don’t Care ...

Page 53

... Non-default BCR settings for burst WRITE at end of row : Fixed or variable latency, WAIT active LOW, WAIT asserted during delay. (shown as solid line) 2. WAIT will be assert for LC cycles for variables latency cycles for fixed latency. End of row t HD Valid input Valid input t KTHL t KOH Note 2 53 EMC646SP16AK 4Mx16 CellularRAM Valid input Valid input t KTHL t KOH Don’t Care ...

Page 54

... See burst interrupt diagrams for cases where CE# stays LOW between bursts. CEM t CLK CBPH Note refresh opportunity is satisfied by either of the following two conditions: a) clocked CE# CEM 54 EMC646SP16AK 4Mx16 CellularRAM Valid Address CSP BOE t t ACLK KOH ...

Page 55

... ACLK Valid High-Z Output V OE# IH 2nd Cycle Write LB#/UB# IH 2nd Cycle Write DQ[15:0] IN High-Z 2nd Cycle Write V IL CEM 55 EMC646SP16AK 4Mx16 CellularRAM t HD High-Z t OHZ t KOH Valid Valid Valid Valid Output Output Output Output t ACLK Don’ ...

Page 56

... BOE ACLK High EMC646SP16AK 4Mx16 CellularRAM t HD High OHZ KOH Valid Valid Valid Valid Output Output Output Output Don’t Care . CEM Undefined ...

Page 57

... ACLK High EMC646SP16AK 4Mx16 CellularRAM OHZ t BOE KOH Valid Valid Valid Valid Output Output Output Output Don’t Care . CEM High-Z ...

Page 58

... Valid Address t t AVH CBPH Note WPH Data . A refresh opportunity is satisfied by either of the following two CEM 58 EMC646SP16AK 4Mx16 CellularRAM t CLK Valid Address CSP BOE CEW t t ...

Page 59

... CE# HIGH CE# HIGH for longer than 15ns Valid Address CBPH Note WPH Data . A refresh opportunity is satisfied by either of the following two CEM 59 EMC646SP16AK 4Mx16 CellularRAM t CLK Valid Address CSP BOE CEW ...

Page 60

... A refresh opportunity is satisfied by either of the following two conditions: a) clocked CE# HIGH CE# HIGH for longer than 15ns. t CLK BOE OLZ KHTL CEW t t ACLK Valid Output 60 EMC646SP16AK 4Mx16 CellularRAM t WC Valid Address CBPH CW t Note OHZ CEW High-Z KOH Don’ ...

Page 61

... CE# HIGH CE# HIGH for longer than 15ns. t CLK BOE OLZ KHTL CEW t ACLK Valid Output 61 EMC646SP16AK 4Mx16 CellularRAM Valid Address t t AVS AVH CBPH Note OHZ ...

Page 62

... CE#-controlled WRITEs. CPH Valid Address CPH Note WPH High-Z Data 62 EMC646SP16AK 4Mx16 CellularRAM Valid Address BLZ t OLZ V OH Valid Output V OL Don’t Care ) to schedule the appropriate refresh CPH OHZ ...

Page 63

... AVH CPH t CW Note WPH Data Data 63 EMC646SP16AK 4Mx16 CellularRAM Valid Address OLZ t BLZ V OH Valid Output High Don’t Care ) to schedule the appropriate refresh CPH OHZ t ...

Page 64

... U ----------------------- 3.0V S ----------------------- 2.5V R ----------------------- 2.0V P ----------------------- 1.8V L ----------------------- 1.5V 7. Organization 8 ---------------------- x8 bit 16 ---------------------- x16 bit 32 ---------------------- x32 bit EMC646SP16AK 4Mx16 CellularRAM 7. Organization 8. Version Blank ----------------- Mother die A ----------------------- 2’nd generation B ----------------------- 3’rd generation C ----------------------- 4’th generation D ----------------------- 5’th generation 9. Option Blank ---- No optional mode J ------------ Non-RBC ...

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