k4h281638d Samsung Semiconductor, Inc., k4h281638d Datasheet - Page 42
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k4h281638d
Manufacturer Part Number
k4h281638d
Description
128mb D-die X16 Ddr Sdram
Manufacturer
Samsung Semiconductor, Inc.
Datasheet
1.K4H281638D.pdf
(52 pages)
Available stocks
Company
Part Number
Manufacturer
Quantity
Price
Company:
Part Number:
k4h281638d-TCA2
Manufacturer:
SAMSUNG
Quantity:
660
128Mb D-die(x16) DDR SDRAM
Note 1. VID is the magnitude of the difference between the input level on CK and the input on CK.
I
1. Typical Case : Vdd = 2.5V, T=25’ C
2. Worst Case : Vdd = 2.7V, T= 10’ C
3. Four banks are being interleaved with tRC(min), Burst Mode, Address and Control inputs on NOP edge are not
4. Timing patterns
Input High (Logic 1) Voltage, DQ, DQS and DM signals
Input Low (Logic 0) Voltage, DQ, DQS and DM signals.
Input Differential Voltage, CK and CK inputs
Input Crossing Point Voltage, CK and CK inputs
8. AC Operating Conditions & Timming Specification
8.1 AC Operating Conditions
DD7A
- DDR200(100Mhz, CL=2) : tCK = 10ns, CL2, BL=4, tRRD = 2*tCK, tRCD= 3*tCK, Read with autoprecharge
- DDR266B(133Mhz, CL=2.5) : tCK = 7.5ns, CL=2.5, BL=4, tRRD = 2*tCK, tRCD = 3*tCK
- DDR266A (133Mhz, CL=2) : tCK = 7.5ns, CL2=2, BL=4, tRRD = 2*tCK, tRCD = 3*tCK,Read with autoprecharge
-DDR333(166Mhz,CL=2.5) : tCK=6ns, CL=2.5, BL=4, tRRD=2*tCK, tRCD=3*tCK,Read with autoprecharge
changing. lout = 0mA
*100% of data changing at every burst
Legend : A=Activate, R=Read, W=Write, P=Precharge, N=NOP
Read : A0 N A1 R0 A2 R1 A3 R2 A0 R3 A1 R0 - repeat the same timing with random address changing
*100% of data changing at every burst
Read with autoprecharge
Read : A0 N A1 R0 A2 R1 A3 R2 N R3 A0 N A1 R0 - repeat the same timing with random address changing
Read : A0 N A1 R0 A2 R1 A3 R2 N R3 A0 N A1 R0 - repeat the same timing with random address changing
*100% of data changing at every burst
Read : A0 N A1 R0 A2 R1 A3 R2 N R3 A0 N A1 R0 - repeat the same timing with random address changing
*100% of data changing at every burst
2. The value of V
3. These parameters should be tested at the pim on actual components and may be checked at either the pin or the pad in simula-
tion. the AC and DC input specificatims are refation to a Vref envelope that has been bandwidth limited 20MHz.
: Operating current: Four bank operation
Parameter/Condition
IX
is expected to equal 0.5*V
Table 13. AC operating conditions
DDQ
of the transmitting device and must track variations in the DC level of the same.
- 42 -
Symbol
VIH(AC)
VIL(AC)
VID(AC)
VIX(AC)
0.5*VDDQ-0.2
VREF + 0.31
Min
0.7
REV. 0.6 Oct. 21. 2002
0.5*VDDQ+0.2
VREF - 0.31
VDDQ+0.6
Max
Unit
V
V
V
V
Note
3
3
1
2