hcts273ms Intersil Corporation, hcts273ms Datasheet - Page 6

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hcts273ms

Manufacturer Part Number
hcts273ms
Description
Radiation Hardened Octal D Flip-flop
Manufacturer
Intersil Corporation
Datasheet
NOTE:
NOTES:
1. Except FN test which will be performed 100% Go/No-Go.
1. Each pin except VCC and GND will have a resistor of 10k
2. Each pin except VCC and GND will have a resistor of 680
Group E Subgroup 2
STATIC BURN-IN I TEST CONNECTIONS
STATIC BURN-IN II TEST CONNECTIONS
DYNAMIC BURN-IN TEST CONNECTIONS
2, 5, 6, 9, 12, 15,
2, 5, 6, 9, 12, 15,
CONFORMANCE
OPEN
16, 19
16, 19
GROUPS
-
NOTE: Each pin except VCC and GND will have a resistor of 47K
2, 5, 6, 9, 12, 15, 16, 19
1, 3, 4, 7, 8, 10, 11,
13, 14, 17, 18
Group E, Subgroup 2, sample size is 4 dice/wafer 0 failures.
GROUND
OPEN
METHOD
10
10
TABLE 8. STATIC AND DYNAMIC BURN-IN TEST CONNECTIONS
5005
TABLE 9. IRRADIATION TEST CONNECTIONS
Specifications HCTS273MS
TABLE 7. TOTAL DOSE IRRADIATION
1/2 VCC = 3V 0.5V
2, 5, 6, 9, 12, 15,
PRE RAD
1, 7, 9
GROUND
16, 19
-
-
10
5% for static burn-in
5% for dynamic burn-in
TEST
6
1, 3, 4, 7, 8, 11, 13,
VCC = 6V
POST RAD
14, 17, 18, 20
Table 4
1, 3, 4, 7, 8 11, 13, 14, 17, 18, 20
1, 20
20
0.5V
VCC = 5V
5% for irradiation testing.
PRE RAD
0.5V
1, 9
50kHz
11
READ AND RECORD
-
-
OSCILLATOR
Spec Number
Table 4 (Note 1)
3, 4, 7, 8, 13,
POST RAD
14, 17, 18
25kHz
-
-
518642

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