tpcf8107 TOSHIBA Semiconductor CORPORATION, tpcf8107 Datasheet - Page 3

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tpcf8107

Manufacturer Part Number
tpcf8107
Description
Mosfets Silicon P-channel Mos U-mos
Manufacturer
TOSHIBA Semiconductor CORPORATION
Datasheet

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6. 6. 6. 6. Electrical Characteristics (T
6.1.
6.1.
6.2.
6.2.
6.3.
6.3.
6.4.
6.4.
6.1.
6.1. Static Characteristics
6.2.
6.2. Dynamic Characteristics
6.3.
6.3. Gate Charge Characteristics
6.4.
6.4. Source-Drain Characteristics
Electrical Characteristics (T
Electrical Characteristics (T
Electrical Characteristics (T
Note 5: If a forward bias is applied between gate and source, this device enters V
Note 6: Ensure that the channel temperature does not exceed 150.
Gate leakage current
Drain cut-off current
Drain-source breakdown voltage
Drain-source breakdown voltage
Gate threshold voltage
Drain-source on-resistance
Input capacitance
Reverse transfer capacitance
Output capacitance
Switching time (rise time)
Switching time (turn-on time)
Switching time (fall time)
Switching time (turn-off time)
Total gate charge
(gate-source plus gate-drain)
Gate-source charge 1
Gate-drain charge
Pulsed reverse drain current
Diode forward voltage
Static Characteristics
Static Characteristics
Dynamic Characteristics
Dynamic Characteristics
Gate Charge Characteristics
Gate Charge Characteristics
Source-Drain Characteristics
Source-Drain Characteristics
Static Characteristics
Dynamic Characteristics
Gate Charge Characteristics
Source-Drain Characteristics
source breakdown voltage is lowered in this mode.
Characteristics
Characteristics
Characteristics
Characteristics
(Note 5)
(Note 6)
a a a a
Fig.
Fig.
Fig.
Fig. 6.2.1
= 25    unless otherwise specified)
= 25
= 25
= 25
Symbol
Symbol
Q
C
C
6.2.1
6.2.1
C
6.2.1 Switching Time Test Circuit
Q
t
t
Q
on
off
oss
t
t
gs1
V
V
rss
iss
gd
Symbol
R
r
f
g
(BR)DSS
(BR)DSX
Symbol
DS(ON)
I
I
GSS
DSS
V
V
I
DRP
th
DSF
unless otherwise specified)
unless otherwise specified)
unless otherwise specified)
V
See Figure 6.2.1.
Switching Time Test Circuit
V
Switching Time Test Circuit
Switching Time Test Circuit
DS
DD
V
V
I
I
V
V
V
D
D
= -10 V, V
I
GS
DS
DS
GS
GS
DR
3
= -10 mA, V
= -10 mA, V
-24 V, V
= ±20 V, V
= -30 V, V
= -10 V, I
= -4.5 V, I
= -10 V, I
= -6 A, V
Test Condition
Test Condition
Test Condition
Test Condition
GS
GS
D
D
= 0 V, f = 1 MHz
= -10 V, I
GS
GS
GS
D
GS
DS
= -0.1 mA
= -3 A
= -3 A
= 0 V
= 0 V
= 0 V
= 10 V
= 0 V
D
= -6 A
(BR)DSX
Min
-0.8
Min
Min
Min
-30
-21
mode. Note that the drain-
Typ.
Typ.
Typ.
Typ.
970
170
200
116
7.5
2.4
5.4
29
22
14
33
22
TPCF8107
2010-07-16
Max
±0.1
Max
Max
Max
-2.0
-10
-24
1.2
38
28
Rev.1.0
Unit
Unit
Unit
Unit
mΩ
µA
nC
pF
ns
V
A
V

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