h5ps2g43afr Hynix Semiconductor, h5ps2g43afr Datasheet - Page 11

• Manufacturer Part Number: h5ps2g43afr
• Description: Ddr2 Sdram
• Manufacturer: Hynix Semiconductor

Rev. 0.1 / November 2008
3. AC & DC Operating Conditions
3.1 DC Operating Conditions
3.1.1 Recommended DC Operating Conditions (SSTL_1.8)
Note:
3.1.2 ODT DC electrical characteristics
Note:
Measurement Definition for Rtt(eff): Apply V
and I(V
Measurement Definition for VM: Measurement Voltage at test pin (mid point) with no load.
Rtt effective impedance value for EMR(A6,A2)=0,1; 75 ohm
Rtt effective impedance value for EMR(A6,A2)=1,0; 150 ohm
Rtt effective impedance value for EMR(A6,A2)=1,1; 50 ohm
Deviation of VM with respect to VDDQ/2
1. Min. Typ. and Max. values increase by 100mV for C3(DDR2-533 3-3-3) speed option.
2. VDDQ tracks with VDD,VDDL tracks with VDD. AC parameters are measured with VDD,VDDQ and VDD.
3. The value of VREF may be selected by the user to provide optimum noise margin in the system. Typically the
4. Peak to peak ac noise on VREF may not exceed +/-2% VREF (dc).
5. VTT of transmitting device must track VREF of receiving device.
1. Test condition for Rtt measurements
Symbol
value of VREF is expected to be about 0.5 x VDDQ of the transmitting device and VREF is expected to track varia-
tions in VDDQ
VDDQ
VDDL
VREF
VDD
VTT
IL
(ac)) respectively. V
Supply Voltage
Supply Voltage for DLL
Supply Voltage for Output
Input Reference Voltage
Termination Voltage
PARAMETER/CONDITION
Parameter
IH
(ac), V
delta VM =(
IL
Rtt(eff) =
(ac), and VDDQ values defined in SSTL_18
IH
(ac) and V
0.49*VDDQ
VREF-0.04
2 x Vm
VDDQ
Min.
1.7
1.7
1.7
I(V
V
IL
IH
IH
(ac) to test pin separately, then measure current I(V
(ac) - V
- 1)
(ac)) - I(V
0.50*VDDQ
SYMBOL
Rtt1(eff)
Rtt2(eff)
Rtt3(eff)
delta VM
x 100%
Rating
VREF
Typ.
IL
1.8
1.8
1.8
(ac)
IL
(ac))
MIN NOM MAX
120
60
40
-6
0.51*VDDQ
VREF+0.04
Max.
1.9
1.9
1.9
150
75
50
180
+6
90
60
H5PS2G43AFR
H5PS2G83AFR
Units
mV
UNITS NOTES
V
V
V
V
ohm
ohm
ohm
%
Notes
IH
1,2
1,2
3,4
1
1
1
1
1
(ac))
5
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