IDT70824L25G IDT, Integrated Device Technology Inc, IDT70824L25G Datasheet - Page 5

• Manufacturer Part Number: IDT70824L25G
• Description: IC SARAM 64KBIT 25NS 84PGA
• Manufacturer: IDT, Integrated Device Technology Inc

Specifications of IDT70824L25G

• Format - Memory: RAM
• Memory Type: SARAM
• Memory Size: 64K (4K x 16)
• Speed: 25ns
• Interface: Parallel
• Voltage - Supply: 4.5 V ~ 5.5 V
• Operating Temperature: 0°C ~ 70°C
• Package / Case: 84-PGA
• Lead Free Status / RoHS Status: Contains lead / RoHS non-compliant
• Other names: 70824L25G

DC Electrical Characteristics Over the Operating
Temperature and Supply Voltage Range
NOTES
1. 'X' in part number indicates power rating (S or L).
2. V
3. At f = f
4. f = 0 means no address or control lines change.
5. SCE may transition, but is Low (SCE=V
6. SCE may be - 0.2V, after it is clocked in, since SCLK=V
7. If one port is enabled (either CE or SCE = LOW) then the other port is disabled (SCE or CE = HIGH, respectively). CMOS HIGH > Vcc - 0.2V and LOW < 0.2V, and
8. Industrial temperature: for specific speeds, packages and powers contact your sales office.
Data Retention Characteristics Over All Temperature Ranges
(L Version Only)
NOTES :
1. T
2. t
3. This parameter is guaranteed by device characterization, but is not production tested.
4. To initiate data retention, SCE = V
I
V
t
t
CCDR
CDR
R
Symbol
IDT70824S/L
High-Speed 4K x 16 Sequential Access Random Access Memory
DR
(
3)
I
I
I
TTL HIGH = V
I
I
SB1
SB2
SB3
SB4
Symbol
RC
CC
(3)
A
CC
= +25°C, V
= Read Cycle Time
= 5V, T
Dynamic Operating
Current
(Both Ports Active)
Standby Current
(Both Ports - TTL
Level Inputs)
Standby Current
(One Port - TTL
Level Inputs)
Full Standby Current
(Both Ports -
CMOS Level Inputs)
Full Standby Current
(One Port -
CMOS Level Inputs)
MAX
, address, control lines (except Output Enable), and SCLK are cycling at the maximum frequency read cycle of 1/t
A
Data Retention Current
Chip Deselect to Data Retention Time
Operation Recovery Time
V
Parameter
IH
= +25°C; guaranteed by device characterization but not production tested.
CC
CC
and LOW = V
= 2V; guaranteed by device characterization but not production tested.
for Data Retention
IL
.
Outputs Disabled
Both Ports CE and
One Port CE or
Outputs Disabled (Active Port)
CE
SCE = V
f = f
SCE and CE = V
CMD = V
f = f
CE or SCE = V
Active Port Outputs Disabled,
f=f
SCE > V
V
V
f = 0
SCE > V
f = f
V
IN
IN
IN
(V
Parameter
MAX
L
IH
> V
< 0.
> V
MAX
MAX
MAX
and CE
(4)
(3)
must be clocked in.
LC
(3)
(3)
CC
(3)
CC
2V,
IL
CC
CC
IH
IL
(5)
- 0.2V or V
- 0.2V or
Test Condition
) when clocked in by SCLK.
< 0.2V, V
- 0.2V
- 0.2V
R
= V
IH
IH
IL
(6)
(6,7)
(7)
,
IN
< 0.2V
IH
HC
must be clocked in prior to powerdown.
> V
V
CE = V
V
SCE = V
CMD > V
COM'L
MIL &
IND
COM'L
MIL &
IND
COM'L
MIL &
IND
COM'L
MIL &
IND
COM'L
MIL &
IND
CC
IN
CC
= V
Version
= 2V
- 0.2V)
HC
HC
HC
6.42
HC
or = V
(4)
5
S
L
S
L
S
L
S
L
S
L
S
L
S
L
S
L
S
L
S
L
when SCLK = u
Test Condition
LC
Typ.
180
180
____
____
____
____
115
115
____
____
0.2
____
____
110
110
____
____
(1,2,8)
1.0
Com'l Only
25
25
70824X20
(2)
Max.
380
330
260
230
240
200
____
____
____
____
____
____
____
____
____
____
70
50
15
5
MIL. & IND.
COM'L.
(V
CC
Military and Commercial Temperature Ranges
Typ.
170
170
105
105
100
100
____
____
____
____
____
____
1.0
0.2
____
____
____
____
25
25
Com'l Only
70824X25
= 5.0V ± 10%)
(2)
Max.
360
310
250
220
230
190
____
____
____
____
____
____
____
____
____
____
70
50
15
5
Min.
t
RC
2.0
___
___
___
(2)
Typ.
160
160
160
160
1.0
0.2
1.0
0.2
20
20
20
20
95
95
95
95
90
90
90
90
70824X35
Com'l &
Military
(2)
RC
.
Typ.
Max.
100
100
340
290
400
340
240
210
290
250
220
180
260
215
___
___
___
70
50
85
65
30
15
10
5
(1)
Typ.
155
155
155
155
0.2
0.2
1.0
1.0
16
16
16
16
90
90
90
90
85
85
85
85
70824X45
Com'l &
Military
4000
(2)
Max.
1500
___
___
___
Max.
340
290
400
340
240
210
290
250
220
180
260
215
70
50
85
65
15
30
10
5
3099 tbl 09
3099 tbl 08
Unit
µ A
V
V
V
Unit
mA
mA
mA
mA
mA