TLP2601(TP1,F) Toshiba, TLP2601(TP1,F) Datasheet - Page 62

• Manufacturer Part Number: TLP2601(TP1,F)
• Description: PHOTOCOUPLER HS LOGOUT 8-SMD
• Manufacturer: Toshiba

Specifications of TLP2601(TP1,F)

• Voltage - Isolation: 2500Vrms
• Number Of Channels: 1, Unidirectional
• Current - Output / Channel: 25mA
• Data Rate: 10MBd
• Propagation Delay High - Low @ If: 60ns @ 7.5mA
• Current - Dc Forward (if): 20mA
• Input Type: DC
• Output Type: Open Collector
• Mounting Type: Surface Mount
• Package / Case: 8-SMD (300 mil)
• Number Of Elements: 1
• Forward Voltage: 1.75V
• Forward Current: 20mA
• Output Current: 25mA
• Isolation Voltage: 2500Vrms
• Package Type: PDIP
• Operating Temp Range: 0C to 70C
• Power Dissipation: 40mW
• Propagation Delay Time: 75ns
• Pin Count: 8
• Mounting: Through Hole
• Reverse Breakdown Voltage: 5V
• Operating Temperature Classification: Commercial
• Lead Free Status / RoHS Status: Lead free / RoHS Compliant

9
The above operating life data are estimates extrapolated from long-term light output degradation over a single wafer lot and are
shown as reference only. Operating conditions exceeding the maximum ratings are not guaranteed.
3
3
10000000
1000000
GaA As (DH) LED Projected Light Output Degradation Data
GaA As (DH) LED Projected Operating Life Data
140
120
100
140
120
100
Device Degradation
100000
80
60
40
20
80
60
40
20
10000
0
0
1000
1
1
100
227
2.0
I
I
I
I
I
Failure criteria light output degradation Δ P O < –50%
F
F
F
F
F
150
= 10 mA
= 20 mA
= 30 mA
= 40 mA
= 50 mA
10
10
Test conditions: I
Test conditions: I
100
85
3.0
60
100
100
Test time (h)
Test time (h)
F
F
25
= 50 mA, Ta = 40°C
= 10 mA, Ta = 40°C
1000
1000
0
4.0
I
F
Ambient Temperature (°C)
= 10 mA
I
I
I
I
–30
F
F
F
F
= 20 mA
= 30 mA
= 40 mA
= 50 mA
Projected F50%
operating life
10000
10000
Projected F0.1%
operating life
X-3σ
–50
X-3σ
1 / K(×10
X
X
100000
100000
–73
5.0
−3
)
62
10000000
1000000
140
120
100
100000
80
60
40
20
10000
0
1000
100
1
227
2.0
I
I
I
I
I
150
F
F
F
F
F
Failure criteria light output degradation Δ P O < –30%
= 10 mA
= 20 mA
= 30 mA
= 40 mA
= 50 mA
10
Test conditions: I
100
85
3.0
60
100
Test time (h)
F
25
= 20 mA, Ta = 40°C
1000
0
4.0
Ambient Temperature (°C)
I
I
I
I
I
F
F
F
F
F
–30
= 10 mA
= 20 mA
= 30 mA
= 40 mA
= 50 mA
Projected F0.1%
operating life
Projected F50%
operating life
10000
X-3σ
–50
X
1 / K(×10
100000
–73
5.0
−3
)