EVAL-AD7723CBZ Analog Devices Inc, EVAL-AD7723CBZ Datasheet - Page 10

• Manufacturer Part Number: EVAL-AD7723CBZ
• Description: BOARD EVALUATION FOR AD7723
• Manufacturer: Analog Devices Inc

Specifications of EVAL-AD7723CBZ

• Number Of Adc's: 1
• Number Of Bits: 16
• Sampling Rate (per Second): 1.2M
• Data Interface: Serial, Parallel
• Inputs Per Adc: 1 Differential
• Input Range: ±VREF
• Power (typ) @ Conditions: 475mW @ 1.2MSPS
• Voltage Supply Source: Analog and Digital
• Operating Temperature: -40°C ~ 85°C
• Utilized Ic / Part: AD7723
• Lead Free Status / RoHS Status: Lead free / RoHS Compliant

AD7723
ABSOLUTE MAXIMUM RATINGS
T
Table 5.
Parameter
DV
AV
AV
AGND, AGND1 to DGND
Digital Inputs to DGND
Digital Outputs to DGND
VIN (+), VIN(−) to AGND
REF1 to AGND
REF2 to AGND
Operating Temperature Range
Storage Temperature Range
Junction Temperature
θ
Lead Temperature, Soldering
ESD CAUTION
ESD (electrostatic discharge) sensitive device. Electrostatic charges as high as 4000 V readily accumulate
on the human body and test equipment and can discharge without detection. Although this product features
proprietary ESD protection circuitry, permanent damage may occur on devices subjected to high energy
electrostatic discharges. Therefore, proper ESD precautions are recommended to avoid performance
degradation or loss of functionality.
JA
A
Vapor Phase (60 sec)
Infrared (15 sec)
DD
DD
DD
= 25°C, unless otherwise noted.
Thermal Impedance
, AV
, AV
to DGND
DD1
DD1
to AGND
to DV
DD
Rating
−0.3 V to +7 V
−0.3 V to +7 V
−1 V to +1 V
−0.3 V to +0.3 V
−0.3 V to DV
−0.3 V to DV
−0.3 V to AV
−0.3 V to AV
−0.3 V to AV
−40°C to +85°C
−65°C to +150°C
150°C
95°C/W
215°C
220°C
DD
DD
DD
DD
DD
+ 0.3 V
+ 0.3 V
+ 0.3 V
+ 0.3 V
+ 0.3 V
Rev. C | Page 10 of 32
Stresses above those listed under Absolute Maximum Ratings
may cause permanent damage to the device. This is a stress
rating only; functional operation of the device at these or any
other conditions above those indicated in the operational
section of this specification is not implied. Exposure to absolute
maximum rating conditions for extended periods may affect
device reliability.