ST7FLITE09M6TR STMicroelectronics, ST7FLITE09M6TR Datasheet - Page 94

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ST7FLITE09M6TR

Manufacturer Part Number
ST7FLITE09M6TR
Description
IC MCU 8BIT FLASH 16SOIC
Manufacturer
STMicroelectronics
Series
ST7r
Datasheet

Specifications of ST7FLITE09M6TR

Core Processor
ST7
Core Size
8-Bit
Speed
8MHz
Connectivity
SPI
Peripherals
PWM, WDT
Number Of I /o
13
Program Memory Size
1.5KB (1.5K x 8)
Program Memory Type
FLASH
Eeprom Size
128 x 8
Ram Size
128 x 8
Voltage - Supply (vcc/vdd)
2.4 V ~ 5.5 V
Data Converters
A/D 5x8b
Oscillator Type
Internal
Operating Temperature
-40°C ~ 85°C
Package / Case
16-SOIC
Processor Series
ST7FLITE0x
Core
ST7
Data Bus Width
8 bit
Development Tools By Supplier
ST7FLIT0-IND/USB, ST7FLITE-SK/RAIS, ST7MDT10-DVP3, ST7MDT10-EMU3, STX-RLINK
For Use With
497-5858 - EVAL BOARD PLAYBACK ST7FLITE
Lead Free Status / RoHS Status
Lead free / RoHS Compliant

Available stocks

Company
Part Number
Manufacturer
Quantity
Price
Part Number:
ST7FLITE09M6TR
Manufacturer:
ST
0
ST7LITE0xY0, ST7LITESxY0
EMC CHARACTERISTICS (Cont’d)
13.7.3 Absolute Maximum Ratings (Electrical
Sensitivity)
Based on two different tests (ESD and LU) using
specific measurement methods, the product is
stressed in order to determine its performance in
terms of electrical sensitivity.
ESD absolute maximum ratings
Notes:
1. Data based on characterization results, not tested in production.
13.7.3.2 Static Latch-Up
Electrical Sensitivities
Note:
1. Class description: A Class is an STMicroelectronics internal specification. All its limits are higher than the JEDEC spec-
ifications, that means when a device belongs to Class A it exceeds the JEDEC standard. B Class strictly covers all the
JEDEC criteria (international standard).
94/124
1
V
LU: Two complementary static tests are
required on 10 parts to assess the latch-up
performance. A supply overvoltage (applied to
each power supply pin) and a current injection
Symbol
Symbol
ESD(HBM)
LU
Electro-static discharge voltage
(Human Body Model)
Static latch-up class
Parameter
Ratings
T
conforming to JESD22-A114
T
conforming to JESD78A
A
A
=+25°C
=+25°C
13.7.3.1 Electro-Static Discharge (ESD)
Electro-Static Discharges (a positive then a nega-
tive pulse separated by 1 second) are applied to
the pins of each sample according to each pin
combination. The sample size depends on the
number of supply pins in the device (3 parts*(n+1)
supply pin). This test conforms to the JESD22-
A114A standard.
(applied to each input, output and configurable I/
O pin) are performed on each sample. These
test are compliant with the EIA/JESD 78 IC
latch-up standard.
Conditions
Conditions
Maximum value
4000
II level A
Class
1)
1)
Unit
V

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