73S1209F-44IM/F Maxim Integrated Products, 73S1209F-44IM/F Datasheet - Page 87

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73S1209F-44IM/F

Manufacturer Part Number
73S1209F-44IM/F
Description
IC SMART CARD READER 44-QFN
Manufacturer
Maxim Integrated Products
Datasheet

Specifications of 73S1209F-44IM/F

Core Processor
80515
Core Size
8-Bit
Speed
24MHz
Connectivity
I²C, SmartCard, UART/USART
Peripherals
LED, POR, WDT
Number Of I /o
9
Program Memory Size
32KB (32K x 8)
Program Memory Type
FLASH
Ram Size
2K x 8
Voltage - Supply (vcc/vdd)
2.7 V ~ 5.5 V
Oscillator Type
Internal
Operating Temperature
-40°C ~ 85°C
Package / Case
*
Lead Free Status / RoHS Status
Lead free / RoHS Compliant
Eeprom Size
-
Data Converters
-
Lead Free Status / Rohs Status
Lead free / RoHS Compliant
UG_12xxF_016
4.5.1.2 MasterCard Loopback Test
Teridian used the CETECOM test lab in Germany and the FIME test lab in France (both listed on the
www.emvco.com
their EMV Level I qualification test services.
Figure 12
host side (invokes the test) and the device side (manages all aspect of the smart card’s EMV test).
These test flows are specific to both the FIME and the Cetecom’s Level I Protocol test scripts. Source
code is also included in the release.
Rev. 1.50
Escape command is sent
VISA I (20) or VISA II
with B1 = MCI(10) or
and
(40) in EMVmode
Figure 13
Select Single-Shot or
website) for MasterCard Loopback verification. These labs used the MCI test suite for
Get Delay Time
Loopback test?
Initialization
LoopBack
(in Secs)
show the flow of the entire MCI test suite with the coding to be done on both the
Figure 11: EMV PSE Test Flow Chart
Yes
Setup EMV Test
EMV Power Up
Power-Up Ok
(Good ATR)?
Single Shot
Mode
No
Delay Time Wait
Yes
SingleShot?
No
Start Test by sending a
Block Transfer (0x6F)
with 0 Lenth data
No
73S12xxF Software User Guide
EMV Power
Down
No
87

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