LFXP3E-3TN100C LATTICE SEMICONDUCTOR, LFXP3E-3TN100C Datasheet - Page 59

• Manufacturer Part Number: LFXP3E-3TN100C
• Description: FPGA LatticeXP Family 3000 Cells 320MHz 130nm (CMOS) Technology 1.2V 100-Pin TQFP Tray
• Manufacturer: LATTICE SEMICONDUCTOR

Specifications of LFXP3E-3TN100C

• Package: 100TQFP
• Family Name: LatticeXP
• Device Logic Units: 3000
• Maximum Internal Frequency: 320 MHz
• Typical Operating Supply Voltage: 1.2 V
• Maximum Number Of User I/os: 62
• Ram Bits: 55296
• Re-programmability Support: Yes

Lattice Semiconductor
Switching Test Conditions
Figure 3-13 shows the output test load that is used for AC testing. The specific values for resistance, capacitance,
voltage, and other test conditions are shown in Figure 3-5.
Figure 3-13. Output Test Load, LVTTL and LVCMOS Standards
Table 3-5. Test Fixture Required Components, Non-Terminated Interfaces
LVTTL and other LVCMOS settings (L -> H, H -> L)
LVCMOS 2.5 I/O (Z -> H)
LVCMOS 2.5 I/O (Z -> L)
LVCMOS 2.5 I/O (H -> Z)
LVCMOS 2.5 I/O (L -> Z)
Note: Output test conditions for all other interfaces are determined by the respective standards.
Test Condition
DUT
V
R1
T
3-28
188
R

1
CL
0pF
0pF
C
L
Test Poi nt
DC and Switching Characteristics
LVCMOS 3.3 = 1.5V
LVCMOS 2.5 = V
LVCMOS 1.8 = V
LVCMOS 1.5 = V
LVCMOS 1.2 = V
V
V
V
V
OH
OL
CCIO
CCIO
+ 0.15
- 0.15
/2
/2
LatticeXP Family Data Sheet
Timing Ref.
CCIO
CCIO
CCIO
CCIO
/2
/2
/2
/2
V
V
V
V
V
—
—
—
—
—
OH
OH
OL
OL
T