K4H561638J-LCCC000 Samsung Semiconductor, K4H561638J-LCCC000 Datasheet
K4H561638J-LCCC000
Specifications of K4H561638J-LCCC000
Related parts for K4H561638J-LCCC000
K4H561638J-LCCC000 Summary of contents
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... K4H560438J K4H560838J K4H561638J 256Mb J-die DDR SDRAM Specification with Lead-Free and Halogen-Free INFORMATION IN THIS DOCUMENT IS PROVIDED IN RELATION TO SAMSUNG PRODUCTS, AND IS SUBJECT TO CHANGE WITHOUT NOTICE. NOTHING IN THIS DOCUMENT SHALL BE CONSTRUED AS GRANTING ANY LICENSE, EXPRESS OR IMPLIED, BY ESTOPPEL OR OTHER- WISE, TO ANY INTELLECTUAL PROPERTY RIGHTS IN SAMSUNG PRODUCTS OR TECHNOL- OGY. ALL INFORMATION IN THIS DOCUMENT IS PROVIDED ON AS " ...
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... K4H560438J K4H560838J K4H561638J Table of Contents 1.0 Key Features ...............................................................................................................................4 2.0 Ordering Information ..................................................................................................................4 3.0 Operating Frequencies ...............................................................................................................4 4.0 Pin Description ........................................................................................................................... 5 5.0 Package Physical Dimension ....................................................................................................6 6.0 Block Diagram (16Mb 8Mb 4Mb x 16 I/O x4 Banks) .................................................7 7.0 Input/Output Function Description ............................................................................................8 8.0 Command Truth Table ................................................................................................................9 9.0 General Description ..................................................................................................................10 10 ...
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... K4H560438J K4H560838J K4H561638J Revision History Revision Month Year 1.0 September 2007 - Release revision 1.0 SPEC 1.1 November 2007 - Revised typo of package dimension 1.11 March 2008 - Added Package pin out lead width 1.12 August 2008 - Corrected typo History DDR SDRAM Rev. 1.12 August 2008 ...
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... K4H560438J-LC/LB0 K4H560838J-LC/LCC 32M x 8 K4H560838J-LC/LB3 K4H561638J-LC/LCC 16M x 16 K4H561638J-LC/LB3 Note 1. "-B3"(DDR333, CL=2.5) can support "-B0"(DDR266, CL=2.5)/ "-A2"(DDR266, CL=2). 2. “L” of Part number(12th digit) stands for RoHS compliant and Halogen-Free product. 3.0 Operating Frequencies CC(DDR400@CL=3) Speed @CL2 Speed @CL2 ...
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... K4H560438J K4H560838J K4H561638J 4.0 Pin Description DDQ DDQ SSQ SSQ DDQ DDQ SSQ SSQ DDQ DDQ LDQS LDM CAS CAS RAS RAS AP/A AP/A AP Organization 64Mx4 32Mx8 16Mx16 DM is internally loaded to match DQ and DQS identically. 16Mb x 16 32Mb x 8 64Mb DDQ ...
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... K4H560438J K4H560838J K4H561638J 5.0 Package Physical Dimension #66 #1 (1.50) 0.65TYP (0.71) [0.65 0.08] ± NOTE REFERENCE Detail ASS’Y OUT QUALITY #34 #33 22.22 0.10 ± (10°) (10°) Detail A Detail B Detail B 0.25 ± 0.08 0.30 ± 0.08 66Pin TSOP(II) Package Dimension DDR SDRAM +0 ...
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... K4H560438J K4H560838J K4H561638J 6.0 Block Diagram (16Mb 8Mb 4Mb x 16 I/O x4 Banks) Bank Select CK, CK ADD LCKE LRAS LCBR CK, CK CKE x4/8/16 CK, CK Data Input Register Serial to parallel x8/16/32 8Mx8/ 4Mx16/ 2Mx32 8Mx8/ 4Mx16/ 2Mx32 8Mx8/ 4Mx16/ 2Mx32 8Mx8/ 4Mx16/ 2Mx32 Column Decoder Latency & ...
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... K4H560438J K4H560838J K4H561638J 7.0 Input/Output Function Description SYMBOL TYPE CK, CK Input CKE Input CS Input RAS, CAS, WE Input LDM,(UDM) Input BA0, BA1 Input 12] Input DQ I/O LDQS,(U)DQS I Supply DDQ V Supply SSQ V Supply DD V Supply SS V Input REF Clock : CK and CK are differential clock inputs. All address and control input signals are sam- pled on the positive edge of CK and negative edge of CK ...
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... K4H560438J K4H560838J K4H561638J 8.0 Command Truth Table COMMAND Register Extended MRS Register Mode Register Set Auto Refresh Entry Refresh Self Refresh Exit Bank Active & Row Addr. Read & Auto Precharge Disable Column Address Auto Precharge Enable Write & Auto Precharge Disable ...
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... Banks / 8M x 8Bit x 4 Banks / 4M x 16Bit x 4 Banks Double Data Rate SDRAM 9.0 General Description The K4H560438J / K4H560838J / K4H561638J is 268,435,456 bits of double data rate synchronous DRAM organized as 4x 16,777,216 / 4x 8,388,608 / 4x 4,194,304 words by 4/8/16bits, fabricated with SAMSUNG′s high performance CMOS technology. Synchronous fea- tures with Data Strobe allow extremely high performance up to 400Mb/s per pin ...
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... K4H560438J K4H560838J K4H561638J 12.0 DDR SDRAM Spec Items & Test Conditions Operating current - One bank Active-Precharge; tRC=tRCmin; tCK=10ns for DDR200, tCK=7.5ns for DDR266, 6ns for DDR333, 5ns for DDR400; DQ,DM and DQS inputs changing once per clock cycle; address and control inputs changing once every two clock cycles. ...
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... K4H560438J K4H560838J K4H561638J 14.0 Detailed test condition for DDR SDRAM IDD1 & IDD7A IDD1 : Operating current: One bank operation 1. Typical Case: For DDR200,266,333: Vdd = 2.5V, T=25°C; For DDR400: Vdd=2.6V,T=25°C Worst Case : Vdd = 2.7V, T= 10°C 2. Only one bank is accessed with tRC(min), Burst Mode, Address and Control inputs on NOP edge are changing once per clock cycle ...
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... IDD3N 60 IDD4R 180 IDD4W 180 IDD5 160 Normal IDD6 Low power IDD7A 290 64Mx4 (K4H560438J) B0(DDR266@CL=2.5) 80 110 160 160 160 3 1.5 270 32Mx8 (K4H560838J) / 16Mx16 (K4H561638J 110 100 160 155 160 155 160 150 3 1.5 270 230 DDR SDRAM (V =2.7V 10°C) ...
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... K4H560438J K4H560838J K4H561638J 16.0 AC Operating Conditions Parameter/Condition Input High (Logic 1) Voltage, DQ, DQS and DM signals Input Low (Logic 0) Voltage, DQ, DQS and DM signals. Input Differential Voltage, CK and CK inputs Input Crossing Point Voltage, CK and CK inputs Note : the magnitude of the difference between the input level on CK and the input level on CK. ...
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... K4H560438J K4H560838J K4H561638J 18.0 Overshoot/Undershoot specification for Data, Strobe and Mask Pins Parameter Maximum peak amplitude allowed for overshoot Maximum peak amplitude allowed for undershoot The area between the overshoot signal and V The area between the undershoot signal and GND must be less than or equal to ...
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... K4H560438J K4H560838J K4H561638J 19.0 AC Timming Parameters & Specifications Parameter Row cycle time Refresh row cycle time Row active time RAS to CAS delay Row precharge time Row active to Row active delay Write recovery time Last data in to Read command CL=2.0 Clock cycle time CL=2 ...
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... K4H560438J K4H560838J K4H561638J 20.0 System Characteristics for DDR SDRAM The following specification parameters are required in systems using DDR400, DDR333 & DDR266 devices to ensure proper system performance. these characteristics are for system simulation purposes and are guaranteed by design. Table 1 : Input Slew Rate for DQ, DQS, and DM ...
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... K4H560438J K4H560838J K4H561638J 21.0 Component Notes 1. All voltages referenced Tests for ac timing, IDD, and electrical, ac and dc characteristics, may be conducted at nominal reference/supply voltage levels, but the related specifications and device operation are guaranteed for the full voltage range specified. 3. Figure 1 represents the timing reference load used in defining the relevant timing parameters of the part not intended to be either a precise representation of the typical system environment nor a depiction of the actual load presented by a production tester ...
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... K4H560438J K4H560838J K4H561638J Component Notes 17. For CK & CK slew rate ≥ 1.0 V/ns 18. These parameters guarantee device timing, but they are not necessarily tested on each device. They may be guaranteed by device design or tester correlation. 19. Slew Rate is measured between V OH 20. Min (tCL, tCH) refers to the smaller of the actual clock low time and the actual clock high time as provided to the device (i.e. this value can be greater than the minimum specification limits for tCL and tCH) ...
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... K4H560438J K4H560838J K4H561638J 22.0 System Notes a. Pullup slew rate is characteristized under the test conditions as shown in Figure 2. b. Pulldown slew rate is measured under the test conditions shown in Figure 3. c. Pullup slew rate is measured between (V Pulldown slew rate is measured between (V Pullup and Pulldown slew rate conditions are to be met for any pattern of data, including all outputs switching and only one output switching ...
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... K4H560438J K4H560838J K4H561638J 23.0 IBIS : I/V Characteristics for Input and Output Buffers DDR SDRAM Output Driver V-I Characteristics DDR SDRAM Output driver characteristics are defined for full and half strength operation as selected by the EMRS bit A1. Figures 4 and 5 show the driver characteristics graphically, and tables 8 and 9 show the same data in tabular format suitable for input into simulation tools ...
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... K4H560438J K4H560838J K4H561638J Pulldown Current (mA) Typical Typical Voltage (V) Low High 0.1 6.0 6.8 0.2 12.2 13.5 0.3 18.1 20.1 0.4 24.1 26.6 0.5 29.8 33.0 0.6 34.6 39.1 0.7 39.4 44.2 0.8 43.7 49.8 0.9 47.5 55.2 1.0 51.3 60.3 1.1 54 ...
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... K4H560438J K4H560838J K4H561638J 0.0 Pulldown Characteristics for Weak Output Driver 0.0 0 -10 -20 -30 -40 -50 -60 -70 -80 -90 Pullup Characteristics for Weak Output Driver Figure 5. I/V characteristics for input/output buffers:Pulldown(above) and pullup(below) 1.0 2.0 1.0 2 DDR SDRAM Maximum Typical High Typical Low Minimum ...
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... K4H560438J K4H560838J K4H561638J Pulldown Current (mA) Typical Typical Voltage (V) Low High 0.1 3.4 3.8 0.2 6.9 7.6 0.3 10.3 11.4 0.4 13.6 15.1 0.5 16.9 18.7 0.6 19.6 22.1 0.7 22.3 25.0 0.8 24.7 28.2 0.9 26.9 31.3 1.0 29.0 34.1 1.1 30 ...