STM32F407VET6 STMicroelectronics, STM32F407VET6 Datasheet - Page 96

• Manufacturer Part Number: STM32F407VET6
• Description: Microcontrollers (MCU) ARM M4 512 FLASH 168 Mhz 192kB SRAM
• Manufacturer: STMicroelectronics

Specifications of STM32F407VET6

• Core: ARM Cortex M4
• Processor Series: STM32F4
• Data Bus Width: 32 bit
• Maximum Clock Frequency: 168 MHz
• Program Memory Size: 512 KB
• Data Ram Size: 192 KB
• On-chip Adc: Yes
• Number Of Programmable I/os: 82
• Number Of Timers: 10
• Operating Supply Voltage: 1.7 V to 3.6 V
• Package / Case: LQFP-100
• Mounting Style: SMD/SMT
• A/d Bit Size: 12 bit
• A/d Channels Available: 16
• Interface Type: CAN, I2C, I2S, SPI, UART
• Program Memory Type: Flash
• Lead Free Status / Rohs Status: Details

Electrical characteristics
96/167
A device reset allows normal operations to be resumed.
The test results are given in
defined in application note AN1709.
Table 39.
Designing hardened software to avoid noise problems
EMC characterization and optimization are performed at component level with a typical
application environment and simplified MCU software. It should be noted that good EMC
performance is highly dependent on the user application and the software in particular.
Therefore it is recommended that the user applies EMC software optimization and
prequalification tests in relation with the EMC level requested for his application.
Software recommendations
The software flowchart must include the management of runaway conditions such as:
●
●
●
Prequalification trials
Most of the common failures (unexpected reset and program counter corruption) can be
reproduced by manually forcing a low state on the NRST pin or the Oscillator pins for 1
second.
To complete these trials, ESD stress can be applied directly on the device, over the range of
specification values. When unexpected behavior is detected, the software can be hardened
to prevent unrecoverable errors occurring (see application note AN1015).
V
V
Symbol
FESD
EFTB
Corrupted program counter
Unexpected reset
Critical Data corruption (control registers...)
Voltage limits to be applied on any I/O pin to
induce a functional disturbance
Fast transient voltage burst limits to be
applied through 100 pF on V
pins to induce a functional disturbance
EMS characteristics
Parameter
Table
Doc ID 022152 Rev 2
39. They are based on the EMS levels and classes
DD
and V
SS
V
f
IEC 61000-4-2
V
f
IEC 61000-4-2
HCLK
HCLK
DD
DD
= 3.3 V, LQFP176, T
= 3.3 V, LQFP176, T
= 168 MHz, conforms to
= 168 MHz, conforms to
STM32F405xx, STM32F407xx
Conditions
A
A
= +25 °C,
= +25 °C,
Level/
Class
2B
4A