STM32F217IG STMicroelectronics, STM32F217IG Datasheet - Page 93
STM32F217IG
Manufacturer Part Number
STM32F217IG
Description
High-performance ARM Cortex-M3 MCU with 1 Mbyte Flash, 120 MHz CPU, ART Accelerator, Ethernet, HW crypto
Manufacturer
STMicroelectronics
Datasheet
1.STM32F215ZG.pdf
(168 pages)
Specifications of STM32F217IG
10/100 Ethernet Mac With Dedicated Dma
supports IEEE 1588v2 hardware, MII/RMII
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Table 40.
5.3.15
Symbol
LU
Electrical sensitivities
I/O current injection characteristics
As a general rule, current injection to the I/O pins, due to external voltage below V
above V
operation. However, in order to give an indication of the robustness of the microcontroller in
cases when abnormal injection accidentally happens, susceptibility tests are performed on a
sample basis during device characterization.
Functional susceptibilty to I/O current injection
While a simple application is executed on the device, the device is stressed by injecting
current into the I/O pins programmed in floating input mode. While current is injected into the
I/O pin, one at a time, the device is checked for functional failures.
The failure is indicated by an out of range parameter: ADC error above a certain limit (>5
LSB TUE), out of spec current injection on adjacent pins or other functional failure (for
example reset, oscillator frequency deviation).
The test results are given in
Table 41. I/O current injection susceptibility
Static latch-up class
Symbol
I
INJ
Parameter
DD
(for standard, 3 V-capable I/O pins) should be avoided during normal product
Injected current on all FT pins
Injected current on any other pin
T
Description
A
Table
= +105 °C conforming to JESD78A
Doc ID 17050 Rev 6
41.
Conditions
Functional susceptibility
Negative
injection
–5
–5
Electrical characteristics
injection
Positive
+0
+5
II level A
Class
SS
Unit
mA
or
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