74HCT4017N,652 NXP Semiconductors, 74HCT4017N,652 Datasheet - Page 16

IC JOHNSON DECADE COUNTER 16-DIP

74HCT4017N,652

Manufacturer Part Number
74HCT4017N,652
Description
IC JOHNSON DECADE COUNTER 16-DIP
Manufacturer
NXP Semiconductors
Series
74HCTr

Specifications of 74HCT4017N,652

Package / Case
16-DIP (0.300", 7.62mm)
Logic Type
Counter, Decade
Direction
Up
Number Of Elements
1
Number Of Bits Per Element
10
Reset
Asynchronous
Count Rate
67MHz
Trigger Type
Positive Edge
Voltage - Supply
4.5 V ~ 5.5 V
Operating Temperature
-40°C ~ 125°C
Mounting Type
Through Hole
Counter Type
Decade Counters
Logic Family
74HCT
Number Of Bits
10
Operating Supply Voltage
4.5 V to 5.5 V
Operating Temperature Range
- 40 C to + 125 C
Mounting Style
SMD/SMT
Lead Free Status / RoHS Status
Lead free / RoHS Compliant
Timing
-
Lead Free Status / Rohs Status
Lead free / RoHS Compliant
Other names
568-2847-5
933670310652
Philips Semiconductors
HCMOS family characteristics
FAMILY SPECIFICATIONS
AC CHARACTERISTICS
The “AC CHARACTERISTICS” table lists the guaranteed
limits when a device is tested under the conditions given in
the AC Test Circuits and Waveforms section.
TEST CIRCUITS
Good high-frequency wiring practices should be used in
test circuits. Capacitor leads should be as short as
possible to minimize ripples on the output waveform
transitions and undershoot. Generous ground metal
(preferably a ground-plane) should be used for the same
reasons. A V
decoupling capacitor should be provided
CC
at the test socket, also with short leads. Input signals
should have rise and fall times of 6 ns, a signal swing of
0 V to V
for 74HC and 0 V to 3 V for 74HCT; a 1.0 MHz
CC
square wave is recommended for most propagation delay
tests. The repetition rate must be increased for testing
f
. Two pulse generators are usually required for testing
max
such parameters as set-up time, hold time and removal
time. f
is also tested with 6 ns input rise and fall times,
max
with a 50% duty factor, but for typical f
as high as
max
60 MHz, there are no constraints on rise and fall times.
March 1988
16

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