MT28F004B5 Micron, MT28F004B5 Datasheet - Page 21

• Manufacturer Part Number: MT28F004B5
• Description: FLASH MEMORY
• Manufacturer: Micron

AC TEST CONDITION 1
TIMING PARAMETERS
Commercial Temperature (0°C ≤ T
Extended Temperature (-40°C ≤ T
NOTE: 1. BYTE# = HIGH (MT28F400B5 only).
4Mb Smart 5 Boot Block Flash Memory
F44_B.p65 – Rev. 7/02
SYMBOL
t
t
t
t
t
t
t
A0–A17/(A18)
RC
RC
ACE
ACE
AOE
AOE
AA
Input pulse levels ............................................... 0.4V to 2.4V
Input rise and fall times ................................................ <10ns
Input timing reference level .............................. 0.8V and 2V
Output timing reference level ........................... 0.8V and 2V
Output load ................................. 1 TTL gate and C
DQ0–DQ15
3
4
3
3
4
3
4
WE#
2. Applies to MT28F400B5 only.
3. Measurements tested under AC Test Condition 1, V
4. Measurements tested under AC Test Condition 2, V
OE#
CE#
RP#
V
V
V
V
V
V
V
V
V
V
V
V
IH
IH
IH
IH
IH
IH
IL
IL
IL
IL
IL
IL
MIN
70
60
-6
t RWH
MAX
70
60
35
30
70
A
A
≤ +85°C)
≤ +70°C)
t ACE
MIN
t AA
80
–
WORD-WIDE READ CYCLE
-8/-8 ET
MAX
t AOE
80
40
80
–
–
L
= 100pF
UNITS
SMART 5 BOOT BLOCK FLASH MEMORY
ns
ns
ns
ns
ns
ns
ns
CC
CC
21
= 5V ±10%.
= 5V ±5%.
VALID ADDRESS
AC TEST CONDITION 2
SYMBOL
t
t
t
t
t
t
t
t RC
Input pulse levels ..................................................... 0V to 3V
Input rise and fall times ................................................ <10ns
Input timing reference level ........................................... 1.5V
Output timing reference level ........................................ 1.5V
Output load ................................... 1 TTL gate and C
AA
RWH
RWH
OD
OD
OH
OH
4
3
4
3
4
3
4
Micron Technology, Inc., reserves the right to change products or specifications without notice.
1, 2
VALID DATA
MIN
0
0
-6
MAX
500
500
60
20
15
MIN
©2002, Micron Technology, Inc.
0
–
-8/-8 ET
t OH
DON’T CARE
UNDEFINED
MAX
t OD
500
20
–
–
–
4Mb
L
= 50pF
UNITS
ns
ns
ns
ns
ns
ns
ns