N74F574D,623 NXP Semiconductors, N74F574D,623 Datasheet - Page 6

• Manufacturer Part Number: N74F574D,623
• Description: IC FLIP FLOP TRI-ST OCTAL 20SOIC
• Manufacturer: NXP Semiconductors
• Series: 74Fr
• Type: D-Type Busr

Specifications of N74F574D,623

• Function: Standard
• Output Type: Tri-State Non Inverted
• Number Of Elements: 1
• Number Of Bits Per Element: 8
• Frequency - Clock: 100MHz
• Delay Time - Propagation: 3.2ns
• Trigger Type: Positive Edge
• Current - Output High, Low: 3mA, 24mA
• Voltage - Supply: 4.5 V ~ 5.5 V
• Operating Temperature: 0°C ~ 70°C
• Mounting Type: Surface Mount
• Package / Case: 20-SOIC (7.5mm Width)
• Number Of Circuits: 8
• Logic Family: F
• Logic Type: TTL
• Polarity: Non-Inverting
• Input Type: Single-Ended
• Propagation Delay Time: 5 ns
• High Level Output Current: - 3 mA
• Supply Voltage (max): 5.5 V
• Maximum Operating Temperature: + 70 C
• Mounting Style: SMD/SMT
• Minimum Operating Temperature: 0 C
• Supply Voltage (min): 4.5 V
• Lead Free Status / RoHS Status: Lead free / RoHS Compliant
• Lead Free Status / RoHS Status: Lead free / RoHS Compliant, Lead free / RoHS Compliant
• Other names: 568-4641-2; 933911720623; N74F574D-T; N74F574D-T

1. For conditions shown as MIN or MAX, use the appropriate value specified under recommended operating conditions for the applicable type.
2. All typical values are at V
3. Not more than one output should be shorted at a time. For testing I
Philips Semiconductors
DC ELECTRICAL CHARACTERISTICS
(Over recommended operating free-air temperature range unless otherwise noted.)
NOTES:
1989 Oct 16
SYMBOL
V
V
V
V
V
I
I
I
I
I
I
I
I
I
IH
IL
OZH
OZL
OS
CC
CC
Latch/flip-flop
techniques are preferable in order to minimize internal heating and more accurately reflect operational values. Otherwise, prolonged shorting
of a High output may raise the chip temperature well above normal and thereby cause invalid readings in other parameter tests. In any
sequence of parameter tests, I
O
OH
O
OL
IK
High level output voltage
High-level output voltage
Low level output voltage
Low-level output voltage
Input clamp voltage
Input current at
maximum input voltage
High-level input current
Low-level input current
Off-state output current,
High-level voltage applied
Off-state output current,
Low-level voltage applied
Short-circuit output current
Supply
current
current
(total)
(
)
PARAMETER
CC
I
I
I
I
I
I
= 5V, T
CCH
CCL
CCZ
CCH
CCL
CCZ
OS
tests should be performed last.
amb
NO TAG
74F573
74F574
= 25 C.
V
V
V
V
V
V
CC
CC
CC
CC
IH
IH
TEST CONDITIONS
= MIN, V
= MIN, I
= MIN, V
= MIN, I
MIN, V
MIN, V
V
V
V
V
V
CC
CC
CC
CC
CC
V
CC
= MAX, V
= MAX, V
= MAX, V
= MAX, V
= MAX, V
OS
OH
OL
V
V
V
IL
IL
IL
IL
6
= MIN, I
CC
CC
CC
, the use of high-speed test apparatus and/or sample-and-hold
= MAX,
= MAX,
= MAX
= MAX
MAX,
MAX,
= MAX
= MAX
= MAX
O
O
I
I
I
I
= 7.0V
= 2.7V
= 0.5V
= I
= 2.7V
= 0.5V
NO TAG
NO TAG
IK
10%V
10%V
5%V
5%V
CC
CC
CC
CC
MIN
–60
2.4
2.7
LIMITS
NO TAG
–0.73
74F573/74F574
TYP
0.35
0.35
3.4
30
35
40
45
50
55
MAX
–150
Product specification
0.50
0.50
–1.2
–0.6
100
–50
20
40
50
60
65
70
85
50
UNIT
mA
mA
mA
mA
mA
mA
mA
mA
V
V
V
V
V
A
A
A
A