sl2s5402fud NXP Semiconductors, sl2s5402fud Datasheet - Page 7

• Manufacturer Part Number: sl2s5402fud
• Description: Sl2s5302; Sl2s5402 Icode Slix-s
• Manufacturer: NXP Semiconductors

NXP Semiconductors
8. Limiting values
Table 5.
In accordance with the Absolute Maximum Rating System (IEC 60134).
[1]
[2]
[3]
[4]
SL2S5302_SL2S5402_SDS
Product short data sheet
PUBLIC
Symbol
T
P
T
I
I
V
i(max)
I
stg
j
tot
ESD
Stresses above those listed under Absolute Maximum Ratings may cause permanent damage to the device. This is a stress rating only
and functional operation of the device at these or any conditions other than those described in the operating conditions and electrical
characteristics sections of this specification is not implied.
This product includes circuitry specifically designed for the protection of its internal devices from the damaging effects of excessive static
charge. Nonetheless, it is suggested that conventional precautions be taken to avoid applying greater than the rated maxima.
The voltage between LA and LB is limited by the on-chip voltage limitation circuitry (corresponding to parameter I
For ESD measurement, the IC was mounted in a CDIP8 package.
Limiting values (Wafer)
Parameter
storage temperature
total power dissipation
junction temperature
maximum input current
input current
electrostatic discharge voltage
[1][2]
All information provided in this document is subject to legal disclaimers.
Rev. 3.1 — 1 October 2010
198531
Conditions
LA to LB; peak
LA to LB; RMS
Human body model
SL2S5302; SL2S5402
[3]
[4]
Min
−55
-
−40
-
-
-
© NXP B.V. 2010. All rights reserved.
Max
+125
125
+85
±60
30
±2
I
).
ICODE SLIX-S
Unit
°C
mW
°C
mA
mA
kV
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