mcf52211 Freescale Semiconductor, Inc, mcf52211 Datasheet - Page 32

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mcf52211

Manufacturer Part Number
mcf52211
Description
Mcf5221x 32-bit Microcontroller With Usb On-the-go
Manufacturer
Freescale Semiconductor, Inc
Datasheet

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Electrical Characteristics
2.5
2.6
32
Supply voltage
Standby voltage
Input high voltage
Input low voltage
Input hysteresis
1
2
Maximum number of guaranteed program/erase cycles
Data retention at average operating temperature of 85°C
A program/erase cycle is defined as switching the bits from 1 → 0 → 1.
Reprogramming of a flash memory array block prior to erase is not required.
ESD Protection
DC Electrical Specifications
1
2
Characteristics
ESD target for Human Body Model
ESD target for Machine Model
HBM circuit description
MM circuit description
Number of pulses per pin (HBM)
Number of pulses per pin (MM)
Interval of pulses
• Positive pulses
• Negative pulses
• Positive pulses
• Negative pulses
All ESD testing is in conformity with CDF-AEC-Q100 Stress Test Qualification for
Automotive Grade Integrated Circuits.
A device is defined as a failure if after exposure to ESD pulses the device no longer
meets the device specification requirements. Complete DC parametric and functional
testing is performed per applicable device specification at room temperature followed by
hot temperature, unless specified otherwise in the device specification.
Characteristic
Table 24. SGFM Flash Module Life Characteristics
Parameter
Table 25. ESD Protection Characteristics
Table 26. DC Electrical Specifications
MCF52211 ColdFire Microcontroller, Rev. 1
(V
DDF
= 2.7 to 3.6 V)
1
before failure
Symbol
R
R
HBM
MM
series
series
C
C
Symbol
V
V
V
STBY
V
V
HYS
Value
DD
2000
1500
IH
IL
200
100
200
0
1
1
3
3
1
Retention
Symbol
1
P/E
1, 2
0.06 × V
0.7 × V
V
SS
Min
3.0
3.0
– 0.3
DD
DD
Units
sec
pF
pF
Ω
Ω
V
V
10,000
Freescale Semiconductor
Value
0.35 × V
10
Max
3.6
3.5
4.0
2
DD
Cycles
Years
Unit
Unit
mV
V
V
V
V

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