uja1023 NXP Semiconductors, uja1023 Datasheet - Page 40

• Manufacturer Part Number: uja1023
• Description: Uja1023 Lin-i/o Slave
• Manufacturer: NXP Semiconductors

Philips Semiconductors
Table 33.
V
unless otherwise specified.
[1]
[2]
[3]
[4]
[5]
[6]
[7]
[8]
UJA1023_4
Product data sheet
Symbol
Automatic bit rate detection
t
f
Cyclic function; see
T
t
t
ADC function
E
det(syncbrk)
tol(sync)
on(PxOut)
sample(PxIn)
BAT
cy
ADC
All parameters are guaranteed over the virtual junction temperature range by design. Products are 100 % tested at 125 C ambient
temperature on wafer level (pre-testing). Cased products are 100 % tested at 25 C ambient temperature (final testing). Both pre-testing
and final testing use correlated test conditions to cover the specified temperature and power supply voltage ranges.
Guaranteed by design.
Analog-to-digital conversion starts when valid sync break and sync field is received.
t
and R
RXD is an internal signal.
Not tested.
bit
= 6.5 V to 27 V; V
1
2
= selected bit time 50 s or 96 s (20 kbit/s or 10.4 kbit/s), depends on LSC bit; bus load conditions are (C parallel to R): C
3
4
bus
=
=
Dynamic characteristics
= 1 k , C
t
-------------------------------
t
------------------------------- -
Parameter
sync break detection
threshold
total tolerance slave
synchronized
cycle period
PxOut pin turned on
PxIn sample time
total ADC error
bus rec min
bus rec max
2 t
2 t
bit
bit
bus
Figure 7
VIO
= 6.8 nF and R
= 3 V to 27 V; T
[1]
bus
…continued
= 660
vj
Conditions
complete message
R = 100 k ; C = 10 nF
= 40 C to +150 C; R
V
V
V
V
VIO
BAT
VIO
BAT
or C
= 6.5 V to 12 V;
= 3 V to 27 V;
= 6.5 V to 12 V
= 6.5 V to 27 V
Rev. 04 — 5 July 2006
bus
= 10 nF and R
L(LIN-BAT)
bus
= 500 .
= 500 ; all voltages are referenced to GND;
[4]
[2]
[2]
[2]
[8]
[8]
Min
-
-
-
-
-
-
-
© Koninklijke Philips Electronics N.V. 2006. All rights reserved.
Typ
10
-
16
350
262
-
-
t
bit
UJA1023
Max
-
2
-
-
-
4
6
LIN-I/O slave
bus
Unit
%
ms
LSB
LSB
40 of 48
s
s
s
= 1 nF