lh28f320bfhe-pbtlez Sharp Microelectronics of the Americas, lh28f320bfhe-pbtlez Datasheet - Page 21

• Manufacturer Part Number: lh28f320bfhe-pbtlez
• Description: Flash Memory 32mbit 2mbitx16
• Manufacturer: Sharp Microelectronics of the Americas

1.2.1 Capacitance
NOTE:
1. Sampled, not 100% tested.
1.2.2 AC Input/Output Test Conditions
Input Capacitance
WP#/ACC Input Capacitance
Output Capacitance
Figure 6. Transient Equivalent Testing Load Circuit
Parameter
UN ER
V
0.0
CL Includes Jig
TEST
EVICE
CC
AC test inputs are driven at V
Input timing begins, and output timing ends at V
Worst case speed conditions are when V
Capacitances.
(1)
Figure 5. Transient Input/Output Reference Waveform for V
(T
INPUT
A
V
=+25°C, f=1MHz)
CC
(min)/2
Symbol
C
C
C
OUT
R L =3.3k
IN
IN
C L
N9 4
V
CC
CC
(min) for a Logic "1" and 0.0V for a Logic "0".
OUT
/2
CC
V
Condition
V
V
OUT
=V
LHF32FEZ
IN
IN
=0.0V
=0.0V
CC
=0.0V
TEST POINTS
(min).
CC
/2. Input rise and fall times (10% to 90%) < 5ns.
Table 13. Configuration Capacitance Loading Value
Test Configuration
V
Min.
CC
=2.7V-3.6V
CC
=2.7V-3.6V
Typ.
18
4
6
V
CC
/2
OUTPUT
Max.
22
10
7
C
L
50
Rev. 2.44
(pF)
Unit
pF
pF
pF
18