lh75401 NXP Semiconductors, lh75401 Datasheet - Page 35

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lh75401

Manufacturer Part Number
lh75401
Description
Lh75401; Lh75411 System-on-chip
Manufacturer
NXP Semiconductors
Datasheet

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System-on-Chip
Very Low Operating Temperatures and
Noise Immunity
perature of the transistors in the integrated circuit. The
switching speed of the CMOS circuitry within the SoC
depends partly on Tj, and the lower the operating tem-
perature, the faster the CMOS circuits will switch.
Increased switching noise generated by faster switch-
ing circuits could affect the overall system stability. The
amount of switching noise is directly affected by the
application executed on the SoC.
to meet low industrial temperature standards should use
an external oscillator rather than a crystal to drive the
system clock input of the System-on-Chip. This change
from crystal to oscillator will increase the robustness
(i.e., noise immunity of the clock input to the SoC.
Preliminary data sheet
The junction temperature, Tj, is the operating tem-
NXP recommends that users implementing a system
110
105
100
Figure 5. Maximum Core Frequency versus Voltage and Temperature
95
90
85
80
75
70
25
35
45
NXP Semiconductors
Rev. 01 — 16 July 2007
Temp (
55
˚
Celsius)
65
75
85
1.95 V
1.9 V
1.85 V
1.8 V
1.75 V
1.7 V
1.65 V
1.6 V
2 V
LH75401/LH75411
LH754xx-106
35

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