bgu7008 NXP Semiconductors, bgu7008 Datasheet - Page 14

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bgu7008

Manufacturer Part Number
bgu7008
Description
Sige C Low Noise Amplifier Mmic For Gps, Glonass And Galileo
Manufacturer
NXP Semiconductors
Datasheet
NXP Semiconductors
9. Test information
BGU7008
Product data sheet
Fig 30. Rollett stability factor as a function of
K
(1) T
(2) T
(3) T
(4) T
10
10
10
-1
1
2
0
V
frequency; typical values
amb
amb
amb
amb
CC
= 1.8 V; P
= 40 C
= +25 C
= +85 C
= +125 C
2000
9.1 Quality information
i
= 45 dBm.
4000
All qualification tests are performed according AEC-Q100 except for read point testing
(final test of qualification sample). Which is done only at room temperature.
As part of the zero defect program, the following is part of the industrial test flow:
Part Average Testing
Maverick Lot Handling at assembly factory
6000
8000
All information provided in this document is subject to legal disclaimers.
001aao312
f (MHz)
SiGe:C Low Noise Amplifier MMIC for GPS, GLONASS and Galileo
(1)
(2)
(3)
(4)
10000
Rev. 1 — 22 August 2011
Fig 31. Rollett stability factor as a function of
K
(1) V
(2) V
(3) V
10
10
10
-1
1
2
0
T
frequency; typical values
amb
CC
CC
CC
= 1.5 V
= 1.8 V
= 2.85 V
= 25 C; P
2000
i
4000
= 45 dBm.
6000
BGU7008
(1)
(2)
(3)
8000
© NXP B.V. 2011. All rights reserved.
001aao313
f (MHz)
10000
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