NL27WZ16_07 ONSEMI [ON Semiconductor], NL27WZ16_07 Datasheet - Page 2

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NL27WZ16_07

Manufacturer Part Number
NL27WZ16_07
Description
Dual Buffer
Manufacturer
ONSEMI [ON Semiconductor]
Datasheet
Stresses exceeding Maximum Ratings may damage the device. Maximum Ratings are stress ratings only. Functional operation above the
Recommended Operating Conditions is not implied. Extended exposure to stresses above the Recommended Operating Conditions may affect
device reliability.
1. I
2. Tested to EIA/JESD22−A114−A
3. Tested to EIA/JESD22−A115−A
4. Tested to JESD22−C101−A
5. Tested to EIA/JESD78
MAXIMUM RATINGS
RECOMMENDED OPERATING CONDITIONS
DC Supply Voltage
DC Input Voltage
DC Output Voltage
DC Input Diode Current
DC Output Diode Current
DC Output Sink Current
DC Supply Current per Supply Pin
DC Ground Current per Ground Pin
Storage Temperature Range
Power Dissipation in Still Air
Thermal Resistance
Lead Temperature, 1 mm from Case for 10 Seconds
Junction Temperature Under Bias
ESD Withstand Voltage
Latchup Performance
Supply Voltage
Input Voltage
Output Voltage
Operating Free−Air Temperature
Input Transition Rise or Fall Rate
O
absolute maximum rating must be observed.
Characteristics
Parameter
Above V
CC
Output in Z or LOW State (Note 1)
and Below GND at 85°C (Note 5)
Charged Device Model (Note 4)
http://onsemi.com
Human Body Model (Note 2)
NL27WZ16
Machine Model (Note 3)
V
(High or LOW State)
Data Retention Only
2
V
CC
V
V
CC
CC
CC
SC−88, TSOP−6
= 1.8 V $0.15 V
SC−88, TSOP−6
= 2.5 V $0.2 V
=3.0 V $0.3 V
=5.0 V $0.5 V
V
Operating
V
O
I
< GND
< GND
Symbol
Symbol
I
Latchup
Dt/DV
V
T
I
V
V
I
I
GND
q
V
V
P
I
STG
T
T
ESD
T
V
OK
I
CC
V
CC
IK
JA
CC
O
O
O
A
D
L
J
I
I
*0.5 ≤ V
*40
*0.5 ≤ V
1.65
Min
1.5
*0.5 to )7.0
*65 to )150
0
0
0
0
0
0
> 2000
Value
$100
$100
)150
$500
> 200
*50
*50
$50
200
333
260
N/A
I
O
≤ )7.0
≤ 7.0
)85
Max
5.5
5.5
5.5
5.5
20
20
10
5
°C/W
ns/V
Unit
Unit
mW
mA
mA
mA
mA
mA
mA
°C
°C
°C
°C
V
V
V
V
V
V
V

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