EVAL-ADN2850-25EBZ Analog Devices Inc, EVAL-ADN2850-25EBZ Datasheet - Page 4

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EVAL-ADN2850-25EBZ

Manufacturer Part Number
EVAL-ADN2850-25EBZ
Description
BOARD EVALUATION FOR ADN2850-25
Manufacturer
Analog Devices Inc

Specifications of EVAL-ADN2850-25EBZ

Main Purpose
Digital Potentiometer
Utilized Ic / Part
ADN2850-35
Lead Free Status / RoHS Status
Lead free / RoHS Compliant
Secondary Attributes
-
Embedded
-
Primary Attributes
-
Lead Free Status / Rohs Status
Supplier Unconfirmed
ADN2850
Parameter
CURRENT MONITOR TERMINALS
DYNAMIC CHARACTERISTICS
1
2
3
4
5
6
7
Typicals represent average readings at 25°C and V
Resistor position nonlinearity error (R-INL) is the deviation from an ideal value measured between the maximum resistance and the minimum resistance wiper
positions. R-DNL measures the relative step change from ideal between successive tap positions. The maximum current in each code is defined by I
(see Figure 20).
Guaranteed by design and not subject to production test.
Common-mode leakage current is a measure of the dc leakage from any Terminal B, or Terminal W to a common-mode bias level of V
EEMEM restore mode current is not continuous. Current is consumed while EEMEM locations are read and transferred to the RDAC register.
P
All dynamic characteristics use V
Current Sink at V
Current Sink at V
DISS
Resistor Noise Density
Analog Crosstalk
is calculated from (I
1
2
DD
× V
DD
) + (I
DD
3, 7
= +2.5 V and V
SS
× V
SS
).
SS
DD
Symbol
I
I
e
C
1
2
= −2.5 V.
N_WB
T
= 5 V.
Rev. C | Page 4 of 28
Conditions
1 V
Code= full scale
R
V
Code 2 = midscale,
R
WB
BX
WB
RMS
= GND, Measured V
= 25 kΩ/250 kΩ, T
= 25 kΩ/250 kΩ
, f = 1 kHz, Code 1 = midscale,
A
W1
= 25°C
with V
W2
=
Min
0.0001
0.0001
DD
Typ
20/64
−95/−80
/2.
1
Max
10
10
WB
= (V
DD
− 1)/R
Unit
mA
mA
nV/√Hz
dB
WB
.

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