DS25MB100EVK National Semiconductor, DS25MB100EVK Datasheet - Page 8

• Manufacturer Part Number: DS25MB100EVK
• Description: KIT EVAL FOR DS25MB100
• Manufacturer: National Semiconductor

Specifications of DS25MB100EVK

• Main Purpose: Interface, 2:1 Multiplexer
• Utilized Ic / Part: DS25MB100
• Lead Free Status / RoHS Status: Not applicable / Not applicable
• Secondary Attributes: -
• Embedded: -
• Primary Attributes: -

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Note 4: K28.7 pattern is a 10-bit repeating pattern of K28.7 code group {001111 1000}
K28.5 pattern is a 20-bit repeating pattern of +K28.5 and −K28.5 code groups {110000 0101 001111 1010}
Note 5: Device output random jitter is a measurement of the random jitter contribution from the device. It is derived by the equation sqrt(RJ
RJ
Note 6: Device output deterministic jitter is a measurement of the deterministic jitter contribution from the device. It is derived by the equation (DJ
DJ
driving the device.
Note 7: t
IN1± to OUT±. Another example is the output skew among data paths from IN± to OUT0± and IN± to OUT1±. t
paths of the same port and between similar data paths. An example is the output skew among data paths IN0± to OUT0± and IN1± to OUT1±.
Note 8: Thermal resistances are based on having 16 thermal relief vias on the DAP pad under the 0 airflow condition.
Note 9: This parameter is guaranteed by design and/or characterization. It is not tested in production.
Note 10: ESD tests conform to the following standards:
Timing Diagrams
OUT
OUT
is the total peak-to-peak deterministic jitter measured at the output of the device in pspp, DJ
is the total random jitter measured at the output of the device in psrms, RJ
SKO
Human Body Model applicable standard: MIL-STD-883, Method 3015.7
Machine Model applicable standard: JESD22-A115-A (ESD MM standard of JEDEC)
Field-induced Charge Device Model: Applicable standard JESD22-C101-C (ESD FICDM standard of JEDEC)
is the magnitude difference in the propagation delays among data paths. An example is the output skew among data paths from IN0± to OUT± and
FIGURE 3. Propagation Delay from Input to Output
FIGURE 2. Driver Output Transition Time
8
IN
is the random jitter of the pattern generator driving the device.
IN
is the peak-to-peak deterministic jitter of the pattern generator
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SKO
also refers to the delay skew of the loopback
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OUT
OUT
2
– RJ
–DJ
IN
2
IN
), where
), where