STM8S105C4T6 STMicroelectronics, STM8S105C4T6 Datasheet - Page 103

MCU 16KB FLASH MEM 16MHZ 48LQFP

STM8S105C4T6

Manufacturer Part Number
STM8S105C4T6
Description
MCU 16KB FLASH MEM 16MHZ 48LQFP
Manufacturer
STMicroelectronics
Series
STM8Sr
Datasheet

Specifications of STM8S105C4T6

Core Processor
STM8
Core Size
8-Bit
Speed
16MHz
Connectivity
I²C, IrDA, LIN, SPI, UART/USART
Peripherals
Brown-out Detect/Reset, POR, PWM, WDT
Number Of I /o
38
Program Memory Size
16KB (16K x 8)
Program Memory Type
FLASH
Eeprom Size
1K x 8
Ram Size
2K x 8
Voltage - Supply (vcc/vdd)
2.95 V ~ 5.5 V
Data Converters
A/D 10x10b
Oscillator Type
Internal
Operating Temperature
-40°C ~ 85°C
Package / Case
48-LQFP
Processor Series
STM8S10x
Core
STM8
Data Bus Width
8 bit
Data Ram Size
2 KB
Interface Type
I2C, SPI, UART
Maximum Clock Frequency
16 MHz
Number Of Programmable I/os
38
Number Of Timers
9
Maximum Operating Temperature
+ 85 C
Mounting Style
SMD/SMT
3rd Party Development Tools
EWSTM8
Development Tools By Supplier
STICE-SYS001
Minimum Operating Temperature
- 40 C
On-chip Adc
10 bit, 10 Channel
For Use With
497-10040 - EVAL KIT STM8S DISCOVERY497-10593 - KIT STARTER FOR STM8S207/8 SER497-5046 - KIT TOOL FOR ST7/UPSD/STR7 MCU
Lead Free Status / RoHS Status
Lead free / RoHS Compliant
Other names
497-8818

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STM8S105xx
10.3.12.5
10.3.12.6
Electrostatic discharge (ESD)
Electrostatic discharges (3 positive then 3 negative pulses separated by 1 second) are applied
to the pins of each sample according to each pin combination. The sample size depends on
the number of supply pins in the device (3 parts*(n+1) supply pin). This test conforms to the
JESD22-A114A/A115A standard. For more details, refer to the application note AN1181.
Static latch-up
Two complementary static tests are required on 10 parts to assess the latch-up performance:
This test conforms to the EIA/JESD 78 IC latch-up standard. For more details, refer to the
application note AN1181.
Symbol
Symbol
V
V
(1)
LU
(1)
are higher than the JEDEC specifications, that means when a device belongs to class A it
exceeds the JEDEC standard. B class strictly covers all the JEDEC criteria (international
standard).
ESD(HBM)
ESD(CDM)
A supply overvoltage (applied to each power supply pin)
A current injection (applied to each input, output and configurable I/O pin) are performed
on each sample.
Data based on characterization results, not tested in production
Class description: A Class is an STMicroelectronics internal specification. All its limits
Parameter
Static latch-up class
Ratings
Electrostatic discharge
voltage (Human body model)
Electrostatic discharge
voltage (Charge device
model)
Table 50: ESD absolute maximum ratings
Table 51: Electrical sensitivities
DocID14771 Rev 10
Conditions
T
T
T
A
A
A
= +25 °C
= +85 °C
= +125 °C
Conditions
T
conforming to
JESD22-A114
T
to JESD22-C101
A
A
=+25°C, conforming
= +25°C,
Electrical characteristics
Class
A
IV
Maximum
value
2000
1000
Class
A
A
A
(1)
(1)
103/127
Unit
V
V

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