AT90CAN32-16AU Atmel, AT90CAN32-16AU Datasheet - Page 297
AT90CAN32-16AU
Manufacturer Part Number
AT90CAN32-16AU
Description
IC MCU AVR 32K FLASH 64-TQFP
Manufacturer
Atmel
Series
AVR® 90CANr
Specifications of AT90CAN32-16AU
Core Processor
AVR
Core Size
8-Bit
Speed
16MHz
Connectivity
CAN, EBI/EMI, I²C, SPI, UART/USART
Peripherals
Brown-out Detect/Reset, POR, PWM, WDT
Number Of I /o
53
Program Memory Size
32KB (32K x 8)
Program Memory Type
FLASH
Eeprom Size
1K x 8
Ram Size
2K x 8
Voltage - Supply (vcc/vdd)
2.7 V ~ 5.5 V
Data Converters
A/D 8x10b
Oscillator Type
Internal
Operating Temperature
-40°C ~ 85°C
Package / Case
64-TQFP, 64-VQFP
Processor Series
AT90CANx
Core
AVR8
Data Bus Width
8 bit
Data Ram Size
2 KB
Interface Type
2-Wire/SPI/USART
Maximum Clock Frequency
16 MHz
Number Of Programmable I/os
53
Number Of Timers
4
Operating Supply Voltage
2.7 V to 5.5 V
Maximum Operating Temperature
+ 85 C
Mounting Style
SMD/SMT
3rd Party Development Tools
EWAVR, EWAVR-BL
Development Tools By Supplier
ATAVRDRAGON, ATSTK500, ATSTK600, ATAVRISP2, ATDVK90CAN1, ATADAPCAN01
Minimum Operating Temperature
- 40 C
On-chip Adc
8-ch x 10-bit
No. Of I/o's
53
Eeprom Memory Size
1KB
Ram Memory Size
2KB
Cpu Speed
16MHz
No. Of Timers
4
Rohs Compliant
Yes
For Use With
ATSTK600-TQFP64 - STK600 SOCKET/ADAPTER 64-TQFP770-1007 - ISP 4PORT ATMEL AVR MCU SPI/JTAG770-1005 - ISP 4PORT FOR ATMEL AVR MCU JTAG770-1004 - ISP 4PORT FOR ATMEL AVR MCU SPIATDVK90CAN1 - KIT DEV FOR AT90CAN128 MCU
Lead Free Status / RoHS Status
Lead free / RoHS Compliant
Available stocks
Company
Part Number
Manufacturer
Quantity
Price
Company:
Part Number:
AT90CAN32-16AU
Manufacturer:
ATMEL
Quantity:
250
Part Number:
AT90CAN32-16AU
Manufacturer:
MICROCHIP/微芯
Quantity:
20 000
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22.5
22.6
7679H–CAN–08/08
Using the Boundary-scan Chain
Using the On-chip Debug System
As shown in the state diagram, the Run-Test/Idle state need not be entered between selecting
JTAG instruction and using data registers, and some JTAG instructions may select certain func-
tions to be performed in the Run-Test/Idle, making it unsuitable as an Idle state.
Note:
For detailed information on the JTAG specification, refer to the literature listed in
on page
A complete description of the Boundary-scan capabilities are given in the section
scan IEEE 1149.1 (JTAG)” on page
As shown in
All read or modify/write operations needed for implementing the Debugger are done by applying
AVR instructions via the internal AVR CPU Scan Chain. The CPU sends the result to an I/O
memory mapped location which is part of the communication interface between the CPU and the
JTAG system.
The Break Point Unit implements Break on Change of Program Flow, Single Step Break, two
Program Memory Break Points, and two combined Break Points. Together, the four Break
Points can be configured as either:
• Apply the TMS sequence 1, 1, 0 to re-enter the Run-Test/Idle state. The instruction is latched
• At the TMS input, apply the sequence 1, 0, 0 at the rising edges of TCK to enter the Shift
• Apply the TMS sequence 1, 1, 0 to re-enter the Run-Test/Idle state. If the selected data
• A scan chain on the interface between the internal AVR CPU and the internal peripheral
• Break Point unit.
• Communication interface between the CPU and JTAG system.
• 4 single Program Memory Break Points.
• 3 single Program Memory Break Points + 1 single Data Memory Break Point.
• 2 single Program Memory Break Points + 2 single Data Memory Break Points.
onto the parallel output from the Shift Register path in the Update-IR state. The Exit-IR,
Pause-IR, and Exit2-IR states are only used for navigating the state machine.
Data Register – Shift-DR state. While in this state, upload the selected data register (selected
by the present JTAG instruction in the JTAG Instruction Register) from the TDI input at the
rising edge of TCK. In order to remain in the Shift-DR state, the TMS input must be held low
during input of all bits except the MSB. The MSB of the data is shifted in when this state is left
by setting TMS high. While the data register is shifted in from the TDI pin, the parallel inputs
to the data register captured in the Capture-DR state is shifted out on the TDO pin.
register has a latched parallel-output, the latching takes place in the Update-DR state. The
Exit-DR, Pause-DR, and Exit2-DR states are only used for navigating the state machine.
units.
Independent of the initial state of the TAP Controller, the Test-Logic-Reset state can always be
entered by holding TMS high for five TCK clock periods.
299.
Figure
22-1, the hardware support for On-chip Debugging consists mainly of
300.
AT90CAN32/64/128
“Bibliography”
“Boundary-
297
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