LMK03000CISQ/NOPB National Semiconductor, LMK03000CISQ/NOPB Datasheet - Page 9

IC CLOCK CONDITIONER PREC 48-LLP

LMK03000CISQ/NOPB

Manufacturer Part Number
LMK03000CISQ/NOPB
Description
IC CLOCK CONDITIONER PREC 48-LLP
Manufacturer
National Semiconductor
Type
Clock Conditionerr
Datasheet

Specifications of LMK03000CISQ/NOPB

Pll
Yes
Input
Clock
Output
LVDS, LVPECL
Number Of Circuits
1
Ratio - Input:output
1:8
Differential - Input:output
Yes/Yes
Frequency - Max
1.296GHz
Divider/multiplier
Yes/No
Voltage - Supply
3.15 V ~ 3.45 V
Operating Temperature
-40°C ~ 85°C
Mounting Type
Surface Mount
Package / Case
48-LLP
Frequency-max
1.296GHz
For Use With
LMK03000CEVAL - BOARD EVALUATION LMK03000C
Lead Free Status / RoHS Status
Lead free / RoHS Compliant
Other names
LMK03000CISQ
LMK03000CISQTR
t
t
t
t
t
t
t
CS
CH
CWH
CWL
ES
CES
EWH
Note 4: The Electrical Characteristics table lists guaranteed specifications under the listed Recommended Operating Conditions except as otherwise modified
or specified by the Electrical Characteristics Conditions and/or Notes. Typical specifications are estimations only and are not guaranteed.
Note 5: See 3.5 for more current consumption / power dissipation calculation information.
Note 6: A specification in modeling PLL in-band phase noise is the 1/f flicker noise, L
dB/decade slope. PN10kHz is normalized to a 10 kHz offset and a 1 GHz carrier frequency. PN10kHz = L
(f) is the single side band phase noise of only the flicker noise's contribution to total noise, L(f). To measure L
slope close to the carrier. A high compare frequency and a clean crystal are important to isolating this noise source from the total phase noise, L(f). L
can be masked by the reference oscillator performance if a low power or noisy source is used. The total PLL inband phase noise performance is the sum of
L
Note 7: A specification in modeling PLL in-band phase noise is the Normalized Phase Noise Contribution, L
L
detector frequency of the synthesizer. L
smaller then the loop bandwidth of the PLL, and yet large enough to avoid a substantial noise contribution from the reference and flicker noise. L
masked by the reference oscillator performance if a low power or noisy source is used.
Note 8: Allowable Temperature Drift for Continuous Lock is how far the temperature can drift in either direction and stay in lock from the ambient temperature
and programmed state at which the device was when register R15 was programmed. The action of programming the R15 register, even to the same value,
activates a frequency calibration routine. This implies that the device will work over the entire frequency range, but if the temperature drifts more than the maximum
allowable drift for continuous lock, then it will be necessary to reprogram the R15 register to ensure that the device stays in lock. Regardless of what temperature
the device was initially programmed at, the ambient temperature can never drift outside the range of -40 °C
this specification to be valid, the programmed state of the device must not change after R15 is programmed.
Note 9: The lower sensitivity indicates the typical sensitivity at the lower end of the tuning range, the higher sensitivity at the higher end of the tuning range
Note 10: Output power varies as a function of frequency. When a range is shown, the higher output power applies to the lower frequency and the lower output
power applies to the higher frequency.
Note 11: VCO phase noise is measured assuming the VCO is the dominant noise source due to a 75 Hz loop bandwidth. Over frequency, the phase noise typically
varies by 1 to 2 dB, with the worst case performance typically occurring at the highest frequency. Over temperature, the phase noise typically varies by 1 to 2 dB,
assuming the device is not reprogrammed. Reprogramming R15 will run the frequency calibration routine for optimum phase noise.
Note 12: The Clock Distribution Section includes all parts of the device except the PLL and VCO sections. Typical Additive Jitter specifications apply to the clock
distribution section only and this adds in an RMS fashion to the shaped jitter of the PLL and the VCO.
Note 13: For CLKout frequencies above 1 GHz, the delay should be limited to one half of a period. For 1 GHz and below, the maximum delay can be used.
Note 14: Specification is guaranteed by characterization and is not tested in production.
Note 15: Applies to GOE, LD, and SYNC*.
Note 16: Applies to CLKuWire, DATAuWire, and LEuWire.
Serial Data Timing Diagram
Data bits set on the DATAuWire signal are clocked into a shift register, MSB first, on each rising edge of the CLKuWire signal. On
the rising edge of the LEuWire signal, the data is sent from the shift register to the addressed register determined by the LSB bits.
After the programming is complete the CLKuWire, DATAuWire, and LEuWire signals should be returned to a low state. It is rec-
ommended that the slew rate of CLKuWire, DATAuWire, and LEuWire should be at least 30 V/µs.
Symbol
PLL_flicker
PLL_flat
(f) – 20log(N) – 10log(f
(f) and L
Data to Clock Set Up Time
Data to Clock Hold Time
Clock Pulse Width High
Clock Pulse Width Low
Clock to Enable Set Up Time
Enable to Clock Set Up Time
Enable Pulse Width High
PLL_flat
(f).
COMP
). L
Parameter
PLL_flat
PLL_flat
(f) is the single side band phase noise measured at an offset frequency, f, in a 1 Hz Bandwidth and f
(f) contributes to the total noise, L(f). To measure L
MICROWIRE Timing
See Data Input Timing
See Data Input Timing
See Data Input Timing
See Data Input Timing
See Data Input Timing
See Data Input Timing
See Data Input Timing
9
PLL_flicker
Conditions
(f), which is dominant close to the carrier. Flicker noise has a 10
PLL_flat
(f) the offset frequency, f, must be chosen sufficiently
PLL_flicker
PLL_flat
PLL_flicker
T
A
(10 kHz) - 20log(Fout / 1 GHz), where L
(f), of the PLL and is defined as PN1Hz =
85 °C without violating specifications. For
(f) it is important to be on the 10 dB/decade
Min
25
25
25
25
25
25
8
Typ
COMP
Max
PLL_flat
www.national.com
is the phase
20211403
PLL_flicker
(f) can be
PLL_flicker
Units
ns
ns
ns
ns
ns
ns
ns
(f)

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