SA58632 NXP Semiconductors, SA58632 Datasheet - Page 10

• Manufacturer Part Number: SA58632
• Manufacturer: NXP Semiconductors

NXP Semiconductors
SA58632_2
Product data sheet
Fig 7.
Fig 9.
THD+N
(%)
10
10
(1) V
(2) V
(1) G
(2) G
(3) G
10
1
1
2
10
P
V
THD+N versus frequency
PSRR versus frequency
o
CC
CC
CC
v
v
v
= 0.5 W; G
= 30 dB.
= 20 dB.
= 6 dB.
= 6 V; R
= 7.5 V; R
= 6 V; R
14.2 BTL dynamic characterization
10
2
L
s
v
= 0 Ω; V
= 8 Ω.
L
= 20 dB.
= 16 Ω.
The total harmonic distortion-plus-noise (THD+N) as a function of frequency
was measured with a low-pass filter of 80 kHz. The value of capacitor C2 influences the
behavior of PSRR at low frequencies; increasing the value of C2 increases the
performance of PSRR.
10
ripple
3
(1)
(2)
= 100 mV.
PSRR
(dB)
20
40
60
80
10
10
4
002aac083
f (Hz)
10
10
Rev. 02 — 4 March 2010
5
2
10
3
Fig 8.
(dB)
(1) G
(2) G
(3) G
cs
100
60
70
80
90
10
10
V
Channel separation versus frequency
(1)
(2)
(3)
4
CC
v
v
v
002aac085
f (Hz)
= 30 dB.
= 20 dB.
= 6 dB.
= 6 V; V
10
10
5
2
O
= 2 V; R
2 × 2.2 W BTL audio amplifier
10
L
3
= 8 Ω.
10
SA58632
© NXP B.V. 2010. All rights reserved.
4
(1)
(2)
(3)
002aac084
f (Hz)
(Figure
10
5
10 of 28
7)