MCIMX31 Motorola Semiconductor Products, MCIMX31 Datasheet - Page 51

• Manufacturer Part Number: MCIMX31
• Manufacturer: Motorola Semiconductor Products

Freescale Semiconductor
1
SD17
SD18
SD19
SD20
Test condition: Measured using delay line 5 programmed as follows: ESDCDLY5[15:0] = 0x0703.
ID
DQM (output)
DQS (output)
DQ (output)
DQ and DQM setup time to DQS
DQ and DQM hold time to DQS
Write cycle DQS falling edge to SDCLK output delay time.
Write cycle DQS falling edge to SDCLK output hold time.
SDCLK
SDCLK
SDRAM CLK and DQS related parameters are being measured from the
50% point—that is, high is defined as 50% of signal value and low is
defined as 50% of signal value.
The timing parameters are similar to the ones used in SDRAM data
sheets—that is,
are driven by the ESDCTL at the negative edge of SDCLK and the
parameters are measured at maximum memory frequency.
Table 38. Mobile DDR SDRAM Write Cycle Timing Parameters
Figure 37. Mobile DDR SDRAM Write Cycle Timing Diagram
MCIMX31/MCIMX31L Advance Information, Rev. 3.2
SD17
Table 38
SD17
Preliminary—Subject to Change Without Notice
Parameter
Data
DM
indicates SDRAM requirements. All output signals
SD18
SD18
Data
DM
NOTE
NOTE
Data
SD17
DM
SD17
Data
DM
SD18
SD18
Data
DM
Symbol
tDSS
tDSH
tDS
tDH
Data
DM
SD19
1
Electrical Characteristics
0.95
0.95
Data
DM
Min
1.8
1.8
SD20
Max
—
—
—
—
Data
DM
Unit
ns
ns
ns
ns
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