ADC1210S NXP Semiconductors, ADC1210S Datasheet - Page 29

• Manufacturer Part Number: ADC1210S
• Description: Single 12-bit ADC
• Manufacturer: NXP Semiconductors

NXP Semiconductors
Table 24.
Table 25.
Table 26.
Table 27.
ADC1210S_SER_1
Preliminary data sheet
Bit
7 to 4
3
2 to 0
Bit
7 to 6
5 to 0
Bit
7 to 3
2 to 0
Bit
7 to 0
Symbol
-
DAVINV
DAVPHASE[2:0]
Symbol
-
DIG_OFFSET[5:0]
Symbol
-
TESTPAT_SEL[2:0]
Symbol
TESTPAT_USER[11:4]
Output clock register (address 0012h) bit description
Offset register (address 0013h) bit description
Test pattern register 1 (address 0014h) bit description
Test pattern register 2 (address 0015h) bit description
Access
R/W
R/W
Access
R/W
Access
R/W
Access
R/W
All information provided in this document is subject to legal disclaimers.
Value
0000
0
1
000
001
010
011
100
101
110
111
Value
00
011111
...
000000
...
100000
Value
00000
000
001
010
011
100
101
110
111
Rev. 01 — 9 April 2010
Value
00000000 custom digital test pattern (bits 11 to 4)
Description
not used
output clock data valid (DAV) polarity
DAV phase select
normal
inverted
output clock shifted (ahead) by 3 ns
output clock shifted (ahead) by 2.5 ns
output clock shifted (ahead) by 2 ns
output clock shifted (ahead) by 1.5 ns
output clock shifted (ahead) by 1 ns
output clock shifted (ahead) by 0.5 ns
default value as defined in timing section
output clock shifted (delayed) by 0.5 ns
ADC1210S series; CMOS or LVDS DDR digital outputs
Description
not used
digital test pattern select
digital offset adjustment
Description
not used
...
0
...
off
mid scale
−FS
+FS
toggle ‘1111..1111’/’0000..0000’
custom test pattern
‘1010..1010.’
‘010..1010’
Description
+31 LSB
−32 LSB
ADC1210S series
© NXP B.V. 2010. All rights reserved.
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