TSS463VAN Temic Semiconductors (acquired by ATMEL Corporation), TSS463VAN Datasheet - Page 9

Manufacturer Part Number

TSS463VAN

Description

Van Controller Serial Interface

Manufacturer

Temic Semiconductors (acquired by ATMEL Corporation)

Datasheet

1.TSS463VAN.pdf (24 pages)

3.6 Wafer Process Control

All the inspections and controls are defined as a process step in the production management software,

and are led by using a centralized SPC software. PC system could be summarized as follows:

Critical process parameters are identified by using F.M.E.A. and other advanced tools.

Those parameters are followed in real time with the SPC methodology and their capability is measured

and monthly reported in the Operation Review.

For end 1997, the Cpk target is the following :

all parameters with Cpk above 1.67

Rev. 2 – January 1999

100%

80%

60%

40%

20%

Physical

1995

1996

% of all Parameters per Cpk categories

Q1-

Engineering Database

Q3-

- NANTES :

- Subcontractors :

hermetic packages

plastic packages

Obj.

Qualpack TSS463 / TSS461C

- NANTES :

- S ubcontractors :

hermetic packages

plastic packages

<1.67