ep2sgx30c Altera Corporation, ep2sgx30c Datasheet - Page 232
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ep2sgx30c
Manufacturer Part Number
ep2sgx30c
Description
Stratix Ii Gx Device Data Sheet
Manufacturer
Altera Corporation
Datasheet
1.EP2SGX30C.pdf
(314 pages)
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Timing Model
4–62
Stratix II GX Device Handbook, Volume 1
Notes to
(1)
(2)
(3)
(4)
(5)
PCI
PCI-X
SSTL-2 Class I
SSTL-2 Class II
SSTL-18 Class I
SSTL-18 Class II
1.8-V HSTL Class I
1.8-V HSTL Class II
1.5-V HSTL Class I
1.5-V HSTL Class II
1.2-V HSTL with OCT
Differential SSTL-2 Class I
Differential SSTL-2 Class II
Differential SSTL-18 Class I
Differential SSTL-18 Class II
1.5-V differential HSTL Class I
1.5-V differential HSTL Class II
1.8-V differential HSTL Class I
1.8-V differential HSTL Class II
LVDS
LVPECL
Table 4–53. Output Timing Measurement Methodology for Output Pins (Part 2 of 2)
(5)
Input measurement point at internal node is 0.5 V
Output measuring point for V
Input stimulus edge rate is 0 to V
Less than 50-mV ripple on V
V
CCPD
(5)
Table
I/O Standard
= 2.97 V, less than 50-mV ripple on V
4–53:
CCIO
MEAS
R
S
CC
and V
25
25
25
25
25
25
50
25
(
at buffer output is 0.5 V
Ω
in 0.2 ns (internal signal) from the driver preceding the I/O buffer.
)
CCPD
R
CCIO
, V
100
100
D
(
CCINT
Ω
and V
Loading and Termination
)
CCINT
= 1.15 V with less than 30-mV ripple.
CCPD
R
.
T
50
25
50
25
50
25
50
25
50
25
50
25
50
25
50
25
(
Ω
, V
CCIO
)
CCINT
.
V
CCIO
2.970
2.970
2.325
2.325
1.660
1.660
1.660
1.660
1.375
1.375
1.140
2.325
2.325
1.660
1.660
1.375
1.375
1.660
1.660
2.325
3.135
= 1.15 V.
(V)
V
1.123
1.123
0.790
0.790
0.790
0.790
0.648
0.648
1.123
1.123
0.790
0.790
0.648
0.648
0.790
0.790
TT
(V)
C
Notes
L
10
10
(pF)
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
Altera Corporation
(1), (2),
Measurement
October 2007
V
1.1625
1.1625
0.6875
0.6875
1.1625
1.1625
0.6875
0.6875
1.1625
1.5675
MEAS
1.485
1.485
0.570
Point
0.83
0.83
0.83
0.83
0.83
0.83
0.83
0.83
(3)
(V)
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