saa5547ps NXP Semiconductors, saa5547ps Datasheet - Page 75
saa5547ps
Manufacturer Part Number
saa5547ps
Description
Saa550x; Saa554x Tv Microcontrollers With Closed Captioning Cc And On-screen Display Osd
Manufacturer
NXP Semiconductors
Datasheet
1.SAA5547PS.pdf
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Philips Semiconductors
22 QUALITY AND RELIABILITY
This device will meet Philips Semiconductors General Quality Specification for Business group “Consumer Integrated
Circuits SNW-FQ-611-Part E” . The principal requirements are shown in Tables 30 to 33.
Table 30 Acceptance tests per lot
Table 31 Processability tests (by package family)
Table 32 Reliability tests (by process family)
Table 33 Reliability tests (by device type)
Notes to Tables 30 to 33
1. ppm = fraction of defective devices, in parts per million.
2. FPM = fraction of devices failing at test condition, in Failures Per Million.
3. FITS = Failures In Time Standard.
2000 Feb 23
Mechanical
Electrical
Solderability
Mechanical
Solder heat resistance
Operational life
Humidity life
Temperature cycling
performance
ESD and latch-up
TV microcontrollers with Closed Captioning (CC)
and On-Screen Display (OSD)
TEST
TEST
TEST
TEST
temperature, humidity, bias 1000 hours,
85 C, 85% RH (or equivalent test)
T
ESD Machine model 200 pF, 0 W
latch-up
cumulative target: <80 ppm
cumulative target: <100 ppm
0/16 on all lots
0/15 on all lots
0/15 on all lots
168 hours at T
ESD Human body model 100 pF, 1.5 kW 2000 V
stg(min)
to T
stg(max)
CONDITIONS
CONDITIONS
j
= 150 C
75
REQUIREMENTS
REQUIREMENTS
<1000 FPM at T
<2000 FPM
<2000 FPM
200 V
100 mA, 1.5
REQUIREMENTS
REQUIREMENTS
V
DD
j
Preliminary specification
= 150 C
(absolute maximum)
SAA55xx
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