ISPLSI1032-60LG/883 LATTICE [Lattice Semiconductor], ISPLSI1032-60LG/883 Datasheet - Page 4

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ISPLSI1032-60LG/883

Manufacturer Part Number
ISPLSI1032-60LG/883
Description
High-Density Programmable Logic
Manufacturer
LATTICE [Lattice Semiconductor]
Datasheet

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Output Load Conditions (see figure 2)
3-state levels are measured 0.5V from steady-state
active level.
Switching Test Conditions
DC Electrical Characteristics
1. One output at a time for a maximum duration of one second.
2. Measured using eight 16-bit counters.
3. Typical values are at V
4. Maximum I
SYMBOL
Test Condition
A
B
C
Input Pulse Levels
Input Rise and Fall Time
Input Timing Reference Levels
Output Timing Reference Levels
Output Load
V
V
I
I
I
I
I
I
tion of this datasheet and Thermal Management section of this Data Book to estimate maximum I
CC
IL
IH
IL-isp
IL-PU
OS
OL
OH
2,4
1
Active High
Active Low
Active High to Z
at V
Active Low to Z
at V
OH
OL
Output Low Voltage
Output High Voltage
Input or I/O Low Leakage Current
Input or I/O High Leakage Current
isp Input Low Leakage Current
I/O Active Pull-Up Current
Output Short Circuit Current
Operating Power Supply Current
CC
+ 0.5V
- 0.5V
varies widely with specific device configuration and operating frequency. Refer to the Power Consumption sec-
PARAMETER
CC
= 5V and T
470
470
470
R1
Over Recommended Operating Conditions
A
= 25
390
390
390
390
390
3ns 10% to 90%
R2
GND to 3.0V
See figure 2
o
C.
1.5V
1.5V
I
I
0V
3.5V
0V
0V
V
V
f
OL
OH
TOGGLE
CC
IL
Specifications ispLSI and pLSI 1032
=8 mA
=-4 mA
= 0.5V, V
= 5V, V
Table 2- 0003
35pF
35pF
35pF
5pF
5pF
V
V
V
CL
= 1 MHz
IN
IN
IN
V
IN
V
V
V
OUT
IL
IL
IL
V
IH
CONDITION
4
(MAX.)
(MAX.)
CC
= 3.0V Commercial
= 0.5V
Figure 2. Test Load
*
Device
Output
C L includes Test Fixture and Probe Capacitance.
Industrial/Military
MIN.
2.4
+ 5V
R 1
R 2
CC
TYP.
130
135
.
1996 ISP Encyclopedia
3
C L
MAX.
-150
-150
-200
190
220
-10
0.4
10
*
Table 2- 0007A-32-isp
UNITS
Point
Test
V
V
mA
mA
mA
A
A
A
A

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