IDTIDT71P71604167BQ IDT [Integrated Device Technology], IDTIDT71P71604167BQ Datasheet - Page 12

• Manufacturer Part Number: IDTIDT71P71604167BQ
• Manufacturer: IDT [Integrated Device Technology]

AC Test Conditions
NOTE:
1. Parameters are tested with RQ=250Ω
2. VDDQ does not exceed VDD. During AC testing VDDQ is within 300mV of
Input Waveform
Output Waveform
AC Test Load
(V
Core Power Supply Voltage
I/O Power Supply Voltage
Input High Level
Input Low Level
Input Reference Level
Input Rise/Fall Time
DQ Rise/Fall Time
Output Timing Reference Level
(V
18 Mb DDR II SRAM Burst of 2
DDQ
IDT71P71804 (1M x 18-Bit) 71P71604 (512K x 36-Bit)
DD Q
VDD.
/2) + 0.5V
/2) - 0.5V
Parameter
OUTPUT
Device
Under
Test
V
DDQ
V
REF
/2
ZQ
V
D DQ
Test points
V
Z
/2
R
Symbol
DDQ
0
Q
VREF
TR/TF
V
V
=50
V
V
DDQ
/2
DD
IH
IL
= 250
Test points
(1)
Ω
6112 drw 04
(V
(V
Ω
1.4 to V
1.7 to 1.9
DDQ
DDQ
V
V
0.3/0.3
0.5/0.5
V
Value
DDQ
DDQ
DDQ
V
/2)+ 0.5
/2)- 0.5
6112 drw 08
DDQ
/2
/2
/2
DD
R
V
6112 drw 07
DD Q
/2
L
= 50
/2
Unit
ns
V
V
V
V
V
V
Ω
6112 tbl 11a
Note
2
2
6.42
12
Commercial Temperature Range