SSTUM32866EC/S,518 NXP Semiconductors, SSTUM32866EC/S,518 Datasheet - Page 19

IC BUFFER 1.8V 25BIT 96-LFBGA

SSTUM32866EC/S,518

Manufacturer Part Number
SSTUM32866EC/S,518
Description
IC BUFFER 1.8V 25BIT 96-LFBGA
Manufacturer
NXP Semiconductors
Datasheet

Specifications of SSTUM32866EC/S,518

Logic Type
1:1, 1:2 Configurable Registered Buffer with Parity
Supply Voltage
1.7 V ~ 2 V
Number Of Bits
25, 14
Operating Temperature
0°C ~ 85°C
Mounting Type
Surface Mount
Package / Case
96-LFBGA
Logic Family
SSTU
Logical Function
Registered Buffer
Number Of Elements
1
Number Of Inputs
25
Number Of Outputs
25
High Level Output Current
-8mA
Low Level Output Current
8mA
Package Type
LFBGA
Propagation Delay Time
3ns
Operating Supply Voltage (typ)
1.8V
Operating Supply Voltage (max)
2V
Operating Supply Voltage (min)
1.7V
Clock-edge Trigger Type
Posit/Negat-Edge
Polarity
Non-Inverting
Technology
CMOS
Mounting
Surface Mount
Pin Count
96
Operating Temp Range
0C to 85C
Operating Temperature Classification
Commercial
Lead Free Status / RoHS Status
Lead free / RoHS Compliant
Other names
935284578518
SSTUM32866EC/S-T
SSTUM32866EC/S-T

Available stocks

Company
Part Number
Manufacturer
Quantity
Price
Part Number:
SSTUM32866EC/S,518
Manufacturer:
NXP Semiconductors
Quantity:
10 000
NXP Semiconductors
SSTUM32866_1
Product data sheet
11.2 Data output slew rate measurement information
V
All input pulses are supplied by generators having the following characteristics:
PRR
Fig 16. Load circuit, HIGH-to-LOW slew measurement
Fig 17. Voltage waveforms, HIGH-to-LOW slew rate measurement
Fig 18. Load circuit, LOW-to-HIGH slew measurement
Fig 19. Voltage waveforms, LOW-to-HIGH slew rate measurement
DD
= 1.8 V
(1) C
(1) C
10 MHz; Z
L
L
includes probe and jig capacitance.
includes probe and jig capacitance.
0.1 V.
output
output
o
= 50 ; input slew rate = 1 V/ns
Rev. 01 — 29 June 2007
dv_r
1.8 V DDR2-1G configurable registered buffer with parity
dv_f
DUT
DUT
OUT
OUT
C
20 %
L
dt_r
= 10 pF
C
L
(1)
80 %
dt_f
80 %
= 10 pF
(1)
20 %, unless otherwise specified.
20 %
V
DD
R
test point
test point
R
002aaa379
002aaa377
L
L
= 50
= 50
SSTUM32866
002aaa380
002aaa378
V
V
V
V
© NXP B.V. 2007. All rights reserved.
OL
OH
OL
OH
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